Mukesh Puri

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
BISR mode to test the redundant elements and regular functional mem...
- Patent number 7,913,125
- Issue date Mar 22, 2011
- LSI Corporation
- Ghasi R. Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Hard BISR scheme allowing field repair and usage of reliability con...
- Patent number 7,536,611
- Issue date May 19, 2009
- LST Corporation
- Mukesh K. Puri
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for performing built-in-self-test routines using...
- Patent number 7,493,541
- Issue date Feb 17, 2009
- LSI Corporation
- Ghasi R. Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for performing built-in self-test routines using...
- Patent number 7,260,758
- Issue date Aug 21, 2007
- LSI Corporation
- Ghasi R. Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing implementation suitable for built-in self-repair (BISR) mem...
- Patent number 7,185,243
- Issue date Feb 27, 2007
- LSI Logic Corporation
- Mukesh K. Puri
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method for testing semiconductor devices having built-in self repai...
- Patent number 7,076,699
- Issue date Jul 11, 2006
- LSI Logic Corporation
- Mukesh K. Puri
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan method for built-in-self-repair (BISR)
- Patent number 6,928,598
- Issue date Aug 9, 2005
- LSI Logic Corporation
- Ghasi R. Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Sharing fuse blocks between memories in hard-BISR
- Patent number 6,898,143
- Issue date May 24, 2005
- LSI Logic Corporation
- Mukesh K. Puri
- G11 - INFORMATION STORAGE
Information Patent Grant
Power-on state machine implementation with a counter to control the...
- Patent number 6,871,297
- Issue date Mar 22, 2005
- LSI Logic Corporation
- Mukesh K. Puri
- G11 - INFORMATION STORAGE
Information Patent Grant
Detecting faults in dual port FIFO memories
- Patent number 6,757,854
- Issue date Jun 29, 2004
- LSI Logic Corporation
- Jun Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting interport faults in multiport static memories
- Patent number 6,550,032
- Issue date Apr 15, 2003
- LSI Logic Corporation
- Jun Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing content addressable static memories
- Patent number 6,496,950
- Issue date Dec 17, 2002
- LSI Logic Corporation
- Jun Zhao
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
New hard BISR scheme allowing field repair and usage of reliability...
- Publication number 20050097383
- Publication date May 5, 2005
- Mukesh K. Puri
- G11 - INFORMATION STORAGE
Information Patent Application
Novel bisr mode to test the redundant elements and regular function...
- Publication number 20050097417
- Publication date May 5, 2005
- Ghasi R. Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
SHARING FUSE BLOCKS BETWEEN MEMORIES IN HARD-BISR
- Publication number 20050047253
- Publication date Mar 3, 2005
- Mukesh K. Puri
- G11 - INFORMATION STORAGE
Information Patent Application
Power-on state machine implementation with a counter to control the...
- Publication number 20030196143
- Publication date Oct 16, 2003
- LSI Logic Corporation
- Mukesh K. Puri
- G11 - INFORMATION STORAGE

Mukesh Puri

Person

Patents Grantslast 30 patents

BISR mode to test the redundant elements and regular functional mem...

Hard BISR scheme allowing field repair and usage of reliability con...

Method and system for performing built-in-self-test routines using...

Method and system for performing built-in self-test routines using...

Testing implementation suitable for built-in self-repair (BISR) mem...

Method for testing semiconductor devices having built-in self repai...

Scan method for built-in-self-repair (BISR)

Sharing fuse blocks between memories in hard-BISR

Power-on state machine implementation with a counter to control the...

Detecting faults in dual port FIFO memories

Detecting interport faults in multiport static memories

Testing content addressable static memories

Patents Applicationslast 30 patents

New hard BISR scheme allowing field repair and usage of reliability...

Novel bisr mode to test the redundant elements and regular function...

SHARING FUSE BLOCKS BETWEEN MEMORIES IN HARD-BISR

Power-on state machine implementation with a counter to control the...