Mula Friedman

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Nes Ziona, IL

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Patents Grantslast 30 patents

Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,842,935
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,521,700
- Issue date Apr 21, 2009
- Applied Materials, Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,098,468
- Issue date Aug 29, 2006
- Applied Materials, Inc.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alternating phase-shift mask inspection method and apparatus
- Patent number 7,072,502
- Issue date Jul 4, 2006
- Applied Materials, Inc.
- Shirley Hemar
- G01 - MEASURING TESTING
Information Patent Grant
Data converter apparatus and method particularly useful for a datab...
- Patent number 6,366,687
- Issue date Apr 2, 2002
- Applied Materials, Inc.
- Meir Aloni
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243918
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243922
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster frame beam system for electron beam lithography
- Publication number 20050274911
- Publication date Dec 15, 2005
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alternating phase-shift mask inspection method and apparatus
- Publication number 20020186879
- Publication date Dec 12, 2002
- Shirley Hemar
- G01 - MEASURING TESTING