Muneaki TAMURA

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe device and method of adjusting the same
- Patent number 11,340,263
- Issue date May 24, 2022
- Tokyo Electron Limited
- Muneaki Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus and probe method
- Patent number 10,310,010
- Issue date Jun 4, 2019
- Tokyo Electron Limited
- Muneaki Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Position accuracy inspecting method, position accuracy inspecting a...
- Patent number 10,006,941
- Issue date Jun 26, 2018
- Tokyo Electron Limited
- Kenta Saiki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test Device, Test Method, and Memory Medium
- Publication number 20200241069
- Publication date Jul 30, 2020
- TOKYO ELECTRON LIMITED
- Muneaki TAMURA
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE AND METHOD OF ADJUSTING THE SAME
- Publication number 20200174040
- Publication date Jun 4, 2020
- TOKYO ELECTRON LIMITED
- Muneaki TAMURA
- G01 - MEASURING TESTING
Information Patent Application
POSITION ACCURACY INSPECTING METHOD, POSITION ACCURACY INSPECTING A...
- Publication number 20170219625
- Publication date Aug 3, 2017
- TOKYO ELECTRON LIMITED
- Kenta Saiki
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND PROBE METHOD
- Publication number 20160161553
- Publication date Jun 9, 2016
- TOKYO ELECTRON LIMITED
- Muneaki TAMURA
- G01 - MEASURING TESTING