Munehiro Tahara

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,934,919
- Issue date Aug 23, 2005
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,925,615
- Issue date Aug 2, 2005
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,886,142
- Issue date Apr 26, 2005
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,555,853
- Issue date Apr 29, 2003
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device having embedded array
- Publication number 20040172606
- Publication date Sep 2, 2004
- FUJITSU LIMITED
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING EMBEDDED ARRAY
- Publication number 20030062632
- Publication date Apr 3, 2003
- NOBORU YOKOTA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having embedded array
- Publication number 20020087941
- Publication date Jul 4, 2002
- FUJITSU LIMITED
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having embedded array
- Publication number 20020084457
- Publication date Jul 4, 2002
- FUJITSU LIMITED
- Noboru Yokota
- G01 - MEASURING TESTING