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Munehiro Yamashita
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Uji-City, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Circuit board testing apparatus and circuit board testing method
Patent number
10,175,284
Issue date
Jan 8, 2019
Nidec-Read Corporation
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board inspecting apparatus and circuit board inspecting method
Patent number
9,874,594
Issue date
Jan 23, 2018
Nidec-Read Corporation
Munehiro Yamashita
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for determining maintenance time for contacts, and testing a...
Patent number
9,678,134
Issue date
Jun 13, 2017
Nidec-Read Corporation
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Insulation inspection method and insulation inspection apparatus
Patent number
9,606,162
Issue date
Mar 28, 2017
Nidec-Read Corporation
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board testing apparatus and method
Patent number
6,462,556
Issue date
Oct 8, 2002
Nidec-Read Corporation
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting wiring on board
Patent number
6,459,272
Issue date
Oct 1, 2002
Nidec-Read Corporation
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for testing electric conductivity of circuit p...
Patent number
6,316,949
Issue date
Nov 13, 2001
Nidec-Read Corporation
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board inspection apparatus and method employing a rapidly c...
Patent number
5,969,530
Issue date
Oct 19, 1999
Nidec-Read Corporation
Munehiro Yamashita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CIRCUIT BOARD TESTING APPARATUS AND CIRCUIT BOARD TESTING METHOD
Publication number
20160103172
Publication date
Apr 14, 2016
NIDEC-READ CORPORATION
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT BOARD INSPECTING APPARATUS AND CIRCUIT BOARD INSPECTING METHOD
Publication number
20150346268
Publication date
Dec 3, 2015
NIDEC-READ CORPORATION
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING MAINTENANCE TIME FOR CONTACTS, AND TESTING A...
Publication number
20150115974
Publication date
Apr 30, 2015
NIDEC-READ CORPORATION
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Application
INSULATION INSPECTION METHOD AND INSULATION INSPECTION APPARATUS
Publication number
20150084643
Publication date
Mar 26, 2015
NIDEC-READ CORPORATION
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT BOARD INSPECTION APPARATUS, CIRCUIT BOARD INSPECTION METHOD...
Publication number
20140354317
Publication date
Dec 4, 2014
NIDEC-READ CORPORATION
Munehiro Yamashita
G01 - MEASURING TESTING
Information
Patent Application
Circuit board testing apparatus and method
Publication number
20010013783
Publication date
Aug 16, 2001
Munehiro Yamashita
G01 - MEASURING TESTING