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Muneki HAMASHIMA
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Fukaya-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Washing/drying apparatus, screening apparatus, washing/drying metho...
Patent number
10,429,402
Issue date
Oct 1, 2019
Nikon Corporation
Tadao Isami
B08 - CLEANING
Information
Patent Grant
Image sensor, image-capturing apparatus and image-capturing system
Patent number
10,412,358
Issue date
Sep 10, 2019
Nikon Corporation
Kenichi Ishiga
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Imaging processing apparatus, image-capturing apparatus, and storag...
Patent number
10,027,942
Issue date
Jul 17, 2018
Nikon Corporation
Kenichi Ishiga
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image sensor, image-capturing apparatus and image capturing system
Patent number
9,906,770
Issue date
Feb 27, 2018
Nikon Corporation
Kenichi Ishiga
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image capturing device and program to control image capturing device
Patent number
9,888,226
Issue date
Feb 6, 2018
Nikon Corporation
Kiyoshige Shibazaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image processing apparatus, image processing method and recording m...
Patent number
9,860,516
Issue date
Jan 2, 2018
Nikon Corporation
Kiyoshige Shibazaki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image processing apparatus, image capturing apparatus, and image pr...
Patent number
9,854,224
Issue date
Dec 26, 2017
Nikon Corporation
Susumu Mori
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image processing device, imaging device, and image processing program
Patent number
9,838,665
Issue date
Dec 5, 2017
Nikon Corporation
Kiyoshige Shibazaki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image processing apparatus, image-capturing apparatus, and storage...
Patent number
9,727,985
Issue date
Aug 8, 2017
Nikon Corporation
Kenichi Ishiga
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Imaging apparatus for generating parallax image data
Patent number
9,706,186
Issue date
Jul 11, 2017
Nikon Corporation
Kiyoshige Shibazaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image processing apparatus and image processing program
Patent number
9,706,190
Issue date
Jul 11, 2017
Nikon Corporation
Kiyoshige Shibazaki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Imaging apparatus, image processing device, computer-readable mediu...
Patent number
9,693,036
Issue date
Jun 27, 2017
Nikon Corporation
Kiyoshige Shibazaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image sensor and imaging device
Patent number
9,532,033
Issue date
Dec 27, 2016
Nikon Corporation
Kiyoshige Shibazaki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image sensor, imaging device and image processing device
Patent number
9,414,046
Issue date
Aug 9, 2016
Nikon Corporation
Muneki Hamashima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image capturing device
Patent number
9,341,935
Issue date
May 17, 2016
Nikon Corporation
Muneki Hamashima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,888,642
Issue date
Feb 15, 2011
Ebara Corporation
Mamoru Nakasuji
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Object observation apparatus and object observation
Patent number
RE41665
Issue date
Sep 14, 2010
Nikon Corporation
Muneki Hamashima
250 - Radiant energy
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,745,784
Issue date
Jun 29, 2010
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
7,601,972
Issue date
Oct 13, 2009
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Method of electric discharge machining a cathode for an electron gun
Patent number
7,598,471
Issue date
Oct 6, 2009
Ebara Corporation
Muneki Hamashima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam apparatus and device production method using the elec...
Patent number
7,439,502
Issue date
Oct 21, 2008
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,423,267
Issue date
Sep 9, 2008
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Object observation apparatus and object observation
Patent number
RE40221
Issue date
Apr 8, 2008
Nikon Corporation
Muneki Hamashima
250 - Radiant energy
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
7,297,949
Issue date
Nov 20, 2007
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,247,848
Issue date
Jul 24, 2007
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and device fabrication method using the ele...
Patent number
7,244,932
Issue date
Jul 17, 2007
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and device manufacturing method using same
Patent number
7,205,559
Issue date
Apr 17, 2007
Ebara Corporation
Muneki Hamashima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection system by charged particle beam and method of manufactur...
Patent number
7,135,676
Issue date
Nov 14, 2006
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus and method of manufacturing semiconductor d...
Patent number
7,129,485
Issue date
Oct 31, 2006
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting substrate, substrate inspecting system and el...
Patent number
7,109,483
Issue date
Sep 19, 2006
Ebara Corporation
Mamoru Nakasuji
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE SENSOR, IMAGE-CAPTURING APPARATUS AND IMAGE-CAPTURING SYSTEM
Publication number
20180139435
Publication date
May 17, 2018
Nikon Corporation
Kenichi ISHIGA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
WASHING/DRYING APPARATUS, SCREENING APPARATUS, WASHING/DRYING METHO...
Publication number
20170045543
Publication date
Feb 16, 2017
Nikon Corporation
Tadao ISAMI
G01 - MEASURING TESTING
Information
Patent Application
PLATE, METHOD FOR MANUFACTURING PLATE, METHOD FOR OBSERVING BIOCHIP...
Publication number
20160144368
Publication date
May 26, 2016
Nikon Corporation
Tadao ISAMI
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
IMAGING APPARATUS
Publication number
20160119608
Publication date
Apr 28, 2016
Nikon Corporation
Kiyoshige SHIBAZAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
BIOCHIP FIXING METHOD, BIOCHIP FIXING DEVICE, AND SCREENING METHOD...
Publication number
20160059201
Publication date
Mar 3, 2016
Nikon Corporation
Takehiko UEDA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
IMAGING APPARATUS, IMAGE PROCESSING DEVICE, COMPUTER-READABLE MEDIU...
Publication number
20150245011
Publication date
Aug 27, 2015
Nikon Corporation
Kiyoshige SHIBAZAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING DEVICE, IMAGING DEVICE, AND IMAGE PROCESSING PROGRAM
Publication number
20150103144
Publication date
Apr 16, 2015
Nikon Corporation
Kiyoshige SHIBAZAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE-CAPTURING APPARATUS, AND STORAGE...
Publication number
20150062307
Publication date
Mar 5, 2015
Nikon Corporation
Kenichi ISHIGA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IMAGE SENSOR, IMAGE-CAPTURING APPARATUS AND IMAGE-CAPTURING SYSTEM
Publication number
20150002634
Publication date
Jan 1, 2015
Nikon Corporation
Kenichi ISHIGA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE-CAPTURING APPARATUS, AND STORAGE...
Publication number
20140375673
Publication date
Dec 25, 2014
Kenichi ISHIGA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE CAPTURING APPARATUS
Publication number
20140340488
Publication date
Nov 20, 2014
Kiyoshige SHIBAZAKI
G02 - OPTICS
Information
Patent Application
IMAGE SENSOR, IMAGING DEVICE AND IMAGE PROCESSING DEVICE
Publication number
20140333732
Publication date
Nov 13, 2014
Muneki HAMASHIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMAGE SENSOR
Publication number
20140307060
Publication date
Oct 16, 2014
Kiyoshige SHIBAZAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD AND RECORDING M...
Publication number
20140184755
Publication date
Jul 3, 2014
Kiyoshige SHIBAZAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE CAPTURING APPARATUS, AND IMAGE PR...
Publication number
20140055571
Publication date
Feb 27, 2014
Nikon Corporation
Susumu Mori
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IMAGE CAPTURING DEVICE AND PROGRAM TO CONTROL IMAGE CAPTURING DEVICE
Publication number
20140055576
Publication date
Feb 27, 2014
Kiyoshige SHIBAZAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING PROGRAM
Publication number
20140036043
Publication date
Feb 6, 2014
Nikon Corporation
Kiyoshige SHIBAZAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL ELEMENT, OPTICAL DEVICE, MEASUREMENT DEVICE, AND SCREENING...
Publication number
20140027653
Publication date
Jan 30, 2014
Nikon Corporation
Susumu MORI
G02 - OPTICS
Information
Patent Application
IMAGE CAPTURING DEVICE
Publication number
20120300041
Publication date
Nov 29, 2012
Nikon Corporation
Muneki Hamashima
G02 - OPTICS
Information
Patent Application
IMAGE SENSOR AND IMAGING DEVICE
Publication number
20120140100
Publication date
Jun 7, 2012
Nikon Corporation
Kiyoshige SHIBAZAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Electron beam apparatus and method of manufacturing semiconductor d...
Publication number
20090050822
Publication date
Feb 26, 2009
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON BEAM APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR D...
Publication number
20090039262
Publication date
Feb 12, 2009
EBARA CORPORATION
Mamoru NAKASUJI
G01 - MEASURING TESTING
Information
Patent Application
Electron beam apparatus and device production method using the elec...
Publication number
20080173815
Publication date
Jul 24, 2008
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Method for inspecting substrate, substrate inspecting system and el...
Publication number
20080121804
Publication date
May 29, 2008
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Inspection system by charged particle beam and method of manufactur...
Publication number
20080042060
Publication date
Feb 21, 2008
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Electron beam apparatus and device production method using the elec...
Publication number
20070272859
Publication date
Nov 29, 2007
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Electron beam apparatus and device manufacturing method using the same
Publication number
20070164226
Publication date
Jul 19, 2007
Nikon Corporation
Muneki Hamashima
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Application
Inspection system by charged particle beam and method of manufactur...
Publication number
20070057186
Publication date
Mar 15, 2007
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Method for inspecting substrate, substrate inspecting system and el...
Publication number
20070045536
Publication date
Mar 1, 2007
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING
Information
Patent Application
Electron beam apparatus and method of manufacturing semiconductor d...
Publication number
20070018101
Publication date
Jan 25, 2007
EBARA CORPORATION
Mamoru Nakasuji
G01 - MEASURING TESTING