Munenori Fukunishi

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Observing method and its apparatus using electron microscope
- Patent number 7,598,491
- Issue date Oct 6, 2009
- Hitachi High-Technologies Corporation
- Munenori Fukunishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and a method for adjusting a focal poi...
- Patent number 7,361,896
- Issue date Apr 22, 2008
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for inspecting a specimen
- Patent number 7,049,587
- Issue date May 23, 2006
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Pattern inspection method and system therefor
- Publication number 20070131877
- Publication date Jun 14, 2007
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Observing method and its apparatus using electron microscope
- Publication number 20060289752
- Publication date Dec 28, 2006
- Munenori Fukunishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for reviewing defects
- Publication number 20060210144
- Publication date Sep 21, 2006
- Kazuo Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning electron microscope and a method for adjusting a focal poi...
- Publication number 20050258366
- Publication date Nov 24, 2005
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern inspection method and system therefor
- Publication number 20030062487
- Publication date Apr 3, 2003
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for inspecting a specimen
- Publication number 20030063792
- Publication date Apr 3, 2003
- Takashi Hiroi
- G01 - MEASURING TESTING