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Muneo Harada
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Nishinomiyai-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for depositing a film and film deposition apparatus
Patent number
9,349,584
Issue date
May 24, 2016
Tokyo Electron Limited
Kippei Sugita
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Method of manufacturing semiconductor device
Patent number
8,716,130
Issue date
May 6, 2014
Tokyo Electron Limited
Kippei Sugita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
8,546,185
Issue date
Oct 1, 2013
Tokyo Electron Limited
Ken Nakao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Film forming apparatus and film forming method
Patent number
8,470,720
Issue date
Jun 25, 2013
Tokyo Electron Limited
Ken Nakao
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Capacitor and manufacturing method thereof
Patent number
8,247,289
Issue date
Aug 21, 2012
Ibiden Co., Ltd.
Yoshiki Yamanishi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Probe needle, method for manufacturing the probe needle and method...
Patent number
8,159,256
Issue date
Apr 17, 2012
Tokyo Electron Limited
Tomohisa Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Switch array
Patent number
7,994,443
Issue date
Aug 9, 2011
Tokyo Electron Limited
Masato Hayashi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Dielectric film capacitor and method of manufacturing the same
Patent number
7,742,277
Issue date
Jun 22, 2010
Ibiden Company Limited
Tomotaka Shinoda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe needle, method for manufacturing the probe needle and method...
Patent number
7,619,424
Issue date
Nov 17, 2009
Tokyo Electron Limited
Tomohisa Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Acceleration sensor and inclination-detecting method
Patent number
7,428,841
Issue date
Sep 30, 2008
Tokyo Electron Limited
Muneo Harada
G01 - MEASURING TESTING
Information
Patent Grant
Microstructure with movable mass
Patent number
6,931,928
Issue date
Aug 23, 2005
Tokyo Electron Limited
Hiroyuki Hashimoto
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration wave detector
Patent number
6,438,243
Issue date
Aug 20, 2002
Sumitomo Metal Industries Ltd.
Naoki Ikeuchi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Impedance detection apparatus and method of physical variable
Patent number
6,373,264
Issue date
Apr 16, 2002
Sumitomo Metal Industries, Ltd.
Toshiyuki Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Impedance-to-voltage converter
Patent number
6,335,642
Issue date
Jan 1, 2002
Sumitomo Metal Industries Limited
Tatsuo Hiroshima
G01 - MEASURING TESTING
Information
Patent Grant
Static capacitance-to-voltage converter and converting method
Patent number
6,331,780
Issue date
Dec 18, 2001
Sumitomo Metal Industries Ltd.
Tatsuo Hiroshima
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance detection system and method
Patent number
6,326,795
Issue date
Dec 4, 2001
Sumitomo Metal Industries, Ltd.
Toshiyuki Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Vibration wave detecting method and vibration wave detector
Patent number
6,227,054
Issue date
May 8, 2001
Sumitomo Metal Industries Limited
Shigeru Ando
G01 - MEASURING TESTING
Information
Patent Grant
Vibration wave detecting method and vibration wave detector
Patent number
6,223,601
Issue date
May 1, 2001
Sumitomo Metal Industries, Limited
Muneo Harada
G01 - MEASURING TESTING
Information
Patent Grant
Impedance-to-voltage converter and converting method
Patent number
6,194,888
Issue date
Feb 27, 2001
Sumitomo Metal Industries Limited
Toshiyuki Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Vibration wave detecting method and vibration wave detector
Patent number
6,079,274
Issue date
Jun 27, 2000
Sumitomo Metal Industries Limited
Shigeru Ando
G01 - MEASURING TESTING
Information
Patent Grant
Vibration wave detecting method and vibration wave detector
Patent number
6,012,334
Issue date
Jan 11, 2000
Sumitomo Metal Industries Limited
Shigeru Ando
G01 - MEASURING TESTING
Information
Patent Grant
Sensor circuit
Patent number
5,973,538
Issue date
Oct 26, 1999
Sumitomo Medal Industries, Ltd.
Guoliang Shou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS, RAW MATERIAL CARTRIDGE, SUBSTRATE P...
Publication number
20220411929
Publication date
Dec 29, 2022
TOKYO ELECTRON LIMITED
Muneo HARADA
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS, PROCESSING GAS CONCENTRATING APPARA...
Publication number
20220372623
Publication date
Nov 24, 2022
TOKYO ELECTRON LIMITED
Muneo HARADA
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
PICKUP METHOD AND PICKUP DEVICE
Publication number
20150214088
Publication date
Jul 30, 2015
TOKYO ELECTRON LIMITED
Ken Nakao
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
METHOD FOR DEPOSITING A FILM AND FILM DEPOSITION APPARATUS
Publication number
20150087158
Publication date
Mar 26, 2015
TOKYO ELECTRON LIMITED
Kippei Sugita
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHOD FOR FORMING SINTERED SILVER COATING FILM, BAKING APPARATUS,...
Publication number
20140239484
Publication date
Aug 28, 2014
TOKYO ELECTRON LIMITED
Kenji MATSUDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR FILLING METAL PASTE, AND METHOD FOR FABRIC...
Publication number
20130216699
Publication date
Aug 22, 2013
TOKYO ELECTRON LIMITED
Eiji Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM AND SEMICONDUCTOR DEVICE...
Publication number
20130181040
Publication date
Jul 18, 2013
TOKYO ELECTRON LIMITED
Shinjiro Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20130089983
Publication date
Apr 11, 2013
TOKYO ELECTRON LIMITED
Kippei Sugita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20120252164
Publication date
Oct 4, 2012
TOKYO ELECTRON LIMITED
Ken NAKAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FILM FORMING APPARATUS AND FILM FORMING METHOD
Publication number
20110039420
Publication date
Feb 17, 2011
TOKYO ELECTRON LIMITED
Ken Nakao
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
APPARATUS FOR TREATING SURFACE AND METHOD OF TREATING SURFACE
Publication number
20110003078
Publication date
Jan 6, 2011
TOKYO ELECTRON LIMITED
Kippei Sugita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBE NEEDLE, METHOD FOR MANUFACTURING THE PROBE NEEDLE AND METHOD...
Publication number
20100077597
Publication date
Apr 1, 2010
TOKYO ELECTRON LIMITED
Tomohisa HOSHINO
G01 - MEASURING TESTING
Information
Patent Application
CHROMATOGRAPHY COLUMN AND MANUFACTURING METHOD OF THE SAME
Publication number
20100032357
Publication date
Feb 11, 2010
TOKYO ELECTRON LIMITED
Tomofumi Kiyomoto
G01 - MEASURING TESTING
Information
Patent Application
CHROMATOGRAPHY DETECTOR
Publication number
20090314065
Publication date
Dec 24, 2009
TOKYO ELECTRON LIMITED
Tomofumi Kiyomoto
G01 - MEASURING TESTING
Information
Patent Application
Wafer-Shaped Measuring Apparatus and Method for Manufacturing the Same
Publication number
20090085031
Publication date
Apr 2, 2009
TOKYO ELECTRON LIMITED
Kenji Matsuda
G01 - MEASURING TESTING
Information
Patent Application
Switch Array
Publication number
20090045039
Publication date
Feb 19, 2009
Masato Hayashi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Probe Needle, Method for Manufacturing the Probe Needle and Method...
Publication number
20070259506
Publication date
Nov 8, 2007
Tomohisa Hoshino
G01 - MEASURING TESTING
Information
Patent Application
Capacitor and manufacturing method thereof
Publication number
20070181928
Publication date
Aug 9, 2007
Yoshiki Yamanishi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Capacitor and manufacturing method thereof
Publication number
20070181556
Publication date
Aug 9, 2007
Yoshiki Yamanishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Dielectric film capacitor and method of manufacturing the same
Publication number
20070126041
Publication date
Jun 7, 2007
TOKYO ELECTRON LIMITED
Tomotaka Shinoda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pattern forming apparatus and method of manufacturing pattern formi...
Publication number
20060255182
Publication date
Nov 16, 2006
Katsuya Okumura
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
Acceleration sensor and inclination-detecting method
Publication number
20060162450
Publication date
Jul 27, 2006
Muneo Harada
G01 - MEASURING TESTING
Information
Patent Application
Microstructure with movable mass
Publication number
20050016271
Publication date
Jan 27, 2005
Hiroyuki Hashimoto
B81 - MICRO-STRUCTURAL TECHNOLOGY