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Muneo Yorinaga
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Okazaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of producing thermistor element and production apparatus for...
Patent number
6,824,713
Issue date
Nov 30, 2004
Denso Corporation
Kaoru Kuzuoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor physical quantity sensor
Patent number
6,450,033
Issue date
Sep 17, 2002
Denso Corporation
Takeshi Ito
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Electric apparatus having a contact intermediary member and method...
Patent number
6,380,622
Issue date
Apr 30, 2002
Denso Corporation
Yasuyoshi Hirai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Angular velocity sensor
Patent number
6,119,518
Issue date
Sep 19, 2000
Nippon Soken, Inc.
Takeshi Itou
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity sensor
Patent number
6,116,087
Issue date
Sep 12, 2000
Nippon Soken, Inc.
Kazushi Asami
G01 - MEASURING TESTING
Information
Patent Grant
Plasma etching method and device manufacturing method thereby
Patent number
5,575,887
Issue date
Nov 19, 1996
Nippondenso Co., Ltd.
Takahiko Yoshida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process of plasma etching silicon
Patent number
5,536,364
Issue date
Jul 16, 1996
Nippon Soken, Inc.
Takahiko Yoshida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Angular velocity sensor and method of adjusting the same
Patent number
5,481,913
Issue date
Jan 9, 1996
Nippondenso Co. Ltd.
Takeshi Ito
G01 - MEASURING TESTING
Information
Patent Grant
Vibration and acoustic wave detecting device employing a piezoelect...
Patent number
4,658,650
Issue date
Apr 21, 1987
Nippondenso Co., Ltd.
Muneo Yorinaga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method of producing thermistor element and production apparatus for...
Publication number
20030038704
Publication date
Feb 27, 2003
Kaoru Kuzuoka
H01 - BASIC ELECTRIC ELEMENTS