Murat BOZKURT

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for monitoring a manufacturing process, inspe...
- Patent number 11,698,346
- Issue date Jul 11, 2023
- ASML Netherlands B.V.
- Ioana Sorina Barbu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology method, patterning device, apparatus and computer program
- Patent number 11,385,553
- Issue date Jul 12, 2022
- ASML Netherlands B.V.
- Zili Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for design of a metrology target
- Patent number 11,003,099
- Issue date May 11, 2021
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method, patterning device, apparatus and computer program
- Patent number 10,996,570
- Issue date May 4, 2021
- ASML Netherlands B.V.
- Zili Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,859,923
- Issue date Dec 8, 2020
- ASML Netherlands B.V.
- Gonzalo Roberto Sanguinetti
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method, apparatus and computer program
- Patent number 10,794,693
- Issue date Oct 6, 2020
- ASML Netherlands B.V.
- Farzad Farhadzadeh
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 10,705,437
- Issue date Jul 7, 2020
- ASML Netherlands B.V.
- Narjes Javaheri
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,564,552
- Issue date Feb 18, 2020
- ASML Netherlands B.V.
- Gonzalo Roberto Sanguinetti
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,481,506
- Issue date Nov 19, 2019
- ASML Netherlands B.V.
- Murat Bozkurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for design of a metrology target
- Patent number 10,437,163
- Issue date Oct 8, 2019
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a property of a target structure, inspection ap...
- Patent number 9,940,703
- Issue date Apr 10, 2018
- ASML Netherlands B.V.
- Murat Bozkurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring a property of a target structure, inspection ap...
- Patent number 9,633,427
- Issue date Apr 25, 2017
- ASML Netherlands B.V.
- Murat Bozkurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY METHOD, PATTERNING DEVICE, APPARATUS AND COMPUTER PROGRAM
- Publication number 20210255553
- Publication date Aug 19, 2021
- ASML NETHERLANDS B.V.
- Zili ZHOU
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20200183290
- Publication date Jun 11, 2020
- ASML NETHERLANDS B.V.
- Gonzalo Roberto SANGUINETTI
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method, Patterning Device, Apparatus and Computer Program
- Publication number 20200110342
- Publication date Apr 9, 2020
- ASML NETHERLANDS B.V.
- Zili ZHOU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20200050114
- Publication date Feb 13, 2020
- ASML NETHERLANDS B.V.
- Murat Bozkurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Design of a Metrology Target
- Publication number 20200033741
- Publication date Jan 30, 2020
- ASML NETHERLANDS B.V.
- Maurits VAN DER SCHAAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
- Publication number 20190107785
- Publication date Apr 11, 2019
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR MONITORING A MANUFACTURING PROCESS, INSPE...
- Publication number 20190072496
- Publication date Mar 7, 2019
- ASML NETHERLANDS B.V.
- Ioana Sorina Barbu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method, Apparatus and Computer Program
- Publication number 20190056220
- Publication date Feb 21, 2019
- ASML NETHERLANDS B.V.
- Farzad FARHADZADEH
- G01 - MEASURING TESTING
Information Patent Application
Method Of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20180373166
- Publication date Dec 27, 2018
- ASML NETHERLANDS B.V.
- Gonzalo Roberto SANGUINETTI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20180321599
- Publication date Nov 8, 2018
- ASML NETHERLANDS B.V.
- Murat BOZKURT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Design of a Metrology Target
- Publication number 20180017881
- Publication date Jan 18, 2018
- ASML NETHERLANDS B.V.
- Maurits VAN DER SCHAAR
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring a Property of a Target Structure, Inspection Ap...
- Publication number 20170206649
- Publication date Jul 20, 2017
- ASML NETHERLANDS B.V.
- Murat BOZKURT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Measuring a Property of a Target Structure, Inspection Ap...
- Publication number 20160086324
- Publication date Mar 24, 2016
- ASML NETHERLANDS B.V.
- Murat BOZKURT
- G06 - COMPUTING CALCULATING COUNTING

Murat BOZKURT

Person

Patents Grantslast 30 patents

Methods and apparatus for monitoring a manufacturing process, inspe...

Metrology method, patterning device, apparatus and computer program

Method and apparatus for design of a metrology target

Metrology method, patterning device, apparatus and computer program

Method of measuring a structure, inspection apparatus, lithographic...

Metrology method, apparatus and computer program

Metrology method and apparatus, computer program and lithographic s...

Method of measuring a structure, inspection apparatus, lithographic...

Method of measuring a structure, inspection apparatus, lithographic...

Method and apparatus for design of a metrology target

Method of measuring a property of a target structure, inspection ap...

Method of measuring a property of a target structure, inspection ap...

Patents Applicationslast 30 patents

METROLOGY METHOD, PATTERNING DEVICE, APPARATUS AND COMPUTER PROGRAM

Method of Measuring a Structure, Inspection Apparatus, Lithographic...

Metrology Method, Patterning Device, Apparatus and Computer Program

Method of Measuring a Structure, Inspection Apparatus, Lithographic...

Method and Apparatus for Design of a Metrology Target

Metrology Method and Apparatus, Computer Program and Lithographic S...

METHODS AND APPARATUS FOR MONITORING A MANUFACTURING PROCESS, INSPE...

Metrology Method, Apparatus and Computer Program

Method Of Measuring a Structure, Inspection Apparatus, Lithographic...

Method of Measuring a Structure, Inspection Apparatus, Lithographic...

Method and Apparatus for Design of a Metrology Target

Method of Measuring a Property of a Target Structure, Inspection Ap...

Method of Measuring a Property of a Target Structure, Inspection Ap...