Mustafa Akbulut

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and methods for classifying anomalies of sample surfaces
- Patent number 7,315,365
- Issue date Jan 1, 2008
- KLA-Tencor Corporation
- Wayne Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for classifying anomalies of sample surfaces
- Patent number 7,038,772
- Issue date May 2, 2006
- KLA-Tencor Corporation
- Wayne Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for classifying anomalies of sample surfaces
- Patent number 7,016,031
- Issue date Mar 21, 2006
- KLA-Tencor Corporation
- Wayne Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for classifying anomalies of sample surfaces
- Patent number 6,590,645
- Issue date Jul 8, 2003
- KLA-Tencor Corporation
- Wayne Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and methods for classifying anomalies of sample surfaces
- Publication number 20060192951
- Publication date Aug 31, 2006
- Wayne Chen
- G01 - MEASURING TESTING
Information Patent Application
System and methods for classifying anomalies of sample surfaces
- Publication number 20040169852
- Publication date Sep 2, 2004
- Wayne Chen
- G01 - MEASURING TESTING
Information Patent Application
System and methods for classifying anomalies of sample surfaces
- Publication number 20040085532
- Publication date May 6, 2004
- Wayne Chen
- G01 - MEASURING TESTING