Mustapha Slamani

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South Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Filter and amplification circuit for outputting ultra-wide band (UW...
- Patent number 11,095,329
- Issue date Aug 17, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Ahmad Alagry
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Absolute phase measurement testing device and technique
- Patent number 10,949,005
- Issue date Mar 16, 2021
- GLOBALFOUNDRIES U.S. INC.
- Mustapha Slamani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing phase noise in output signal of device under test using tra...
- Patent number 10,432,325
- Issue date Oct 1, 2019
- GLOBALFOUNDRIES Inc.
- Mustapha Slamani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Phase measurement for phased array devices using shared local oscil...
- Patent number 10,181,915
- Issue date Jan 15, 2019
- GLOBALFOUNDRIES Inc.
- Mustapha Slamani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High power radio frequency (RF) in-line wafer testing
- Patent number 9,599,657
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Grant
Circuit test system and method using a wideband multi-tone test signal
- Patent number 9,448,280
- Issue date Sep 20, 2016
- International Business Machines Corporation
- Timothy M. Platt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ABSOLUTE PHASE MEASUREMENT TESTING DEVICE AND TECHNIQUE
- Publication number 20200379585
- Publication date Dec 3, 2020
- GLOBALFOUNDRIES INC.
- Mustapha SLAMANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH POWER RADIO FREQUENCY (RF) IN-LINE WAFER TESTING
- Publication number 20140184258
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Hanyi DING
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TEST SYSTEM AND METHOD USING A WIDEBAND MULTI-TONE TEST SIGNAL
- Publication number 20130226499
- Publication date Aug 29, 2013
- International Business Machines Corporation
- Timothy M. Platt
- G01 - MEASURING TESTING