Musubu Koishi

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical connector
- Patent number 8,238,701
- Issue date Aug 7, 2012
- Precise Gauges Co., Ltd.
- Musubu Koishi
- G02 - OPTICS
Information Patent Grant
Optical device and fabrication method and apparatus for the same
- Patent number 7,400,799
- Issue date Jul 15, 2008
- Precise Gauges Co., Ltd.
- Musubu Koishi
- G02 - OPTICS
Information Patent Grant
Method and apparatus for core alignment between optical components
- Patent number 6,970,627
- Issue date Nov 29, 2005
- SOEI Patents, Trademark & Law
- Musubu Koishi
- G01 - MEASURING TESTING
Information Patent Grant
Photodetector apparatus
- Patent number 5,808,746
- Issue date Sep 15, 1998
- Hamamatsu Photonics K.K.
- Musubu Koishi
- G02 - OPTICS
Information Patent Grant
Optical source position adjustment device
- Patent number 5,700,084
- Issue date Dec 23, 1997
- Hamamatsu Photonics K.K.
- Manabu Yasukawa
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measuring using electro-optic material's change in refracti...
- Patent number 5,666,062
- Issue date Sep 9, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measurement system
- Patent number 5,631,555
- Issue date May 20, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical feedback photodetection apparatus
- Patent number 5,614,708
- Issue date Mar 25, 1997
- Hamamatsu Photonics K.K.
- Musubu Koishi
- G02 - OPTICS
Information Patent Grant
Synchronous signal detection apparatus with a photoconductive photo...
- Patent number 5,591,962
- Issue date Jan 7, 1997
- Hamamatsu Photonics K.K.
- Musubu Koishi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Decay characteristic measuring apparatus
- Patent number 5,548,124
- Issue date Aug 20, 1996
- Hamamatsu Photonics K.K.
- Akira Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring apparatus
- Patent number 5,534,992
- Issue date Jul 9, 1996
- Hamamatsu Photonics K.K.
- Akira Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Optical frequency mixing apparatus
- Patent number 5,535,044
- Issue date Jul 9, 1996
- Hamamatsu Photonics K.K.
- Akira Takeshima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for measuring spectral characteristics of an optical fibe...
- Patent number 5,493,406
- Issue date Feb 20, 1996
- Hamamatsu Photonics K.K.
- Akihiro Sawaki
- G01 - MEASURING TESTING
Information Patent Grant
Feeble light measuring device
- Patent number 5,250,795
- Issue date Oct 5, 1993
- Hamamatsu Photonics K.K.
- Musubu Koishi
- G01 - MEASURING TESTING
Information Patent Grant
Light waveform measuring apparatus
- Patent number 5,071,249
- Issue date Dec 10, 1991
- Hamamatsu Photonics K.K.
- Akira Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Photon-counting type streak camera device
- Patent number 5,043,584
- Issue date Aug 27, 1991
- Hamamatsu Photonics K.K.
- Musubu Koishi
- G01 - MEASURING TESTING
Information Patent Grant
Light waveform measuring device including a streak camera
- Patent number 5,032,714
- Issue date Jul 16, 1991
- Hamamatsu Photonics K.K.
- Akira Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Framing camera
- Patent number 5,017,829
- Issue date May 21, 1991
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-channel voltage detector
- Patent number 4,958,124
- Issue date Sep 18, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- G01 - MEASURING TESTING
Information Patent Grant
Sampling streak tube with accelerating electrode plate having an op...
- Patent number 4,947,031
- Issue date Aug 7, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical waveform observing apparatus
- Patent number 4,945,224
- Issue date Jul 31, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- G01 - MEASURING TESTING
Information Patent Grant
Optical waveform observing apparatus
- Patent number 4,942,293
- Issue date Jul 17, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source driving device
- Patent number 4,928,248
- Issue date May 22, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Akira Takahashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Spectrum measuring apparatus
- Patent number 4,917,492
- Issue date Apr 17, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- G01 - MEASURING TESTING
Information Patent Grant
Deflecting voltage generating circuit
- Patent number 4,914,359
- Issue date Apr 3, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Akira Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Ultrafast continuous imaging apparatus
- Patent number 4,875,093
- Issue date Oct 17, 1989
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Time interval measuring device
- Patent number 4,827,317
- Issue date May 2, 1989
- Hamamatsu Photonics Kabushiki Kaisha
- Yoshihiko Mizushima
- G01 - MEASURING TESTING
Information Patent Grant
Streak camera unit with elliptical deflection
- Patent number 4,801,796
- Issue date Jan 31, 1989
- Hamamatsu Photonics Kabushiki Kaisha
- Katsuyuki Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double sweep streak camera device
- Patent number 4,740,685
- Issue date Apr 26, 1988
- Hamamatsu Photonics Kabushiki Kaisha
- Musubu Koishi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Instruments for measuring light pulses clocked at high repetition r...
- Patent number 4,694,154
- Issue date Sep 15, 1987
- Hamamatsu Photonics Kabushiki Kaisha
- Yutaka Tsuchiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL CONNECTOR
- Publication number 20100046888
- Publication date Feb 25, 2010
- Musubu Koishi
- G02 - OPTICS
Information Patent Application
Optical device and fabrication method and apparatus for the same
- Publication number 20060140537
- Publication date Jun 29, 2006
- PRECISE GAUGES Co,. Ltd.
- Musubu Koishi
- G02 - OPTICS
Information Patent Application
Method and apparatus for core alignment between optical components
- Publication number 20040008339
- Publication date Jan 15, 2004
- Musubu Koishi
- G01 - MEASURING TESTING

Musubu Koishi

Person

Patents Grantslast 30 patents

Optical connector

Optical device and fabrication method and apparatus for the same

Method and apparatus for core alignment between optical components

Photodetector apparatus

Optical source position adjustment device

Voltage measuring using electro-optic material's change in refracti...

Voltage measurement system

Optical feedback photodetection apparatus

Synchronous signal detection apparatus with a photoconductive photo...

Decay characteristic measuring apparatus

Optical measuring apparatus

Optical frequency mixing apparatus

Apparatus for measuring spectral characteristics of an optical fibe...

Feeble light measuring device

Light waveform measuring apparatus

Photon-counting type streak camera device

Light waveform measuring device including a streak camera

Framing camera

Multi-channel voltage detector

Sampling streak tube with accelerating electrode plate having an op...

Optical waveform observing apparatus

Optical waveform observing apparatus

Light source driving device

Spectrum measuring apparatus

Deflecting voltage generating circuit

Ultrafast continuous imaging apparatus

Time interval measuring device

Streak camera unit with elliptical deflection

Double sweep streak camera device

Instruments for measuring light pulses clocked at high repetition r...

Patents Applicationslast 30 patents

OPTICAL CONNECTOR

Optical device and fabrication method and apparatus for the same

Method and apparatus for core alignment between optical components