Muthukrishnan Sankar

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Chennai, IN

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Patents Grantslast 30 patents

Information Patent Grant
Characterization system and method with guided defect discovery
- Patent number 12,062,165
- Issue date Aug 13, 2024
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization system and method with guided defect discovery
- Patent number 11,256,967
- Issue date Feb 22, 2022
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION OF ADAPTIVE PATTERNED WORKPIECES WITH DYNAMIC DESIGN AND...
- Publication number 20240112326
- Publication date Apr 4, 2024
- KLA Corporation
- Pavan Kumar Perali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Characterization System and Method With Guided Defect Discovery
- Publication number 20220172497
- Publication date Jun 2, 2022
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Characterization System and Method With Guided Defect Discovery
- Publication number 20210232872
- Publication date Jul 29, 2021
- KLA Corporation
- Bradley Ries
- G01 - MEASURING TESTING