Membership
Tour
Register
Log in
Muthukumarasamy Karthikeyan
Follow
Person
Fishkill, NY, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Yield enhancement for stacked chips through rotationally-connecting...
Patent number
9,151,781
Issue date
Oct 6, 2015
International Business Machines Corporation
Oleg Gluschenkov
G01 - MEASURING TESTING
Information
Patent Grant
Via chains for defect localization
Patent number
8,546,155
Issue date
Oct 1, 2013
International Business Machines Corporation
Christopher B. D'Aleo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Yield enhancement for stacked chips through rotationally-connecting...
Patent number
8,159,247
Issue date
Apr 17, 2012
International Business Machines Corporation
Oleg Gluschenkov
G01 - MEASURING TESTING
Information
Patent Grant
Real time system for monitoring the commonality, sensitivity, and r...
Patent number
7,856,332
Issue date
Dec 21, 2010
International Business Machines Corporation
Muthukumarasamy Karthikeyan
G01 - MEASURING TESTING
Information
Patent Grant
Efficient circuit and method to measure resistance thresholds
Patent number
7,613,047
Issue date
Nov 3, 2009
International Business Machines Corporation
Jonathan R. Fales
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
VIA CHAINS FOR DEFECT LOCALIZATION
Publication number
20130082257
Publication date
Apr 4, 2013
ST MICROELECTRONICS, INC.
Bahierathan Balasingham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...
Publication number
20120146682
Publication date
Jun 14, 2012
International Business Machines Corporation
Oleg Gluschenkov
G01 - MEASURING TESTING
Information
Patent Application
YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...
Publication number
20110080189
Publication date
Apr 7, 2011
International Business Machines Corporation
Oleg Gluschenkov
G01 - MEASURING TESTING
Information
Patent Application
REAL TIME SYSTEM FOR MONITORING THE COMMONALITY, SENSITIVITY, AND R...
Publication number
20090143999
Publication date
Jun 4, 2009
International Business Machines Corporation
Muthukumarasamy Karthikeyan
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR CIRCUITS CAPABLE OF SELF DETECTING DEFECTS
Publication number
20090129185
Publication date
May 21, 2009
John J. Cassels
G11 - INFORMATION STORAGE
Information
Patent Application
EFFICIENT CIRCUIT AND METHOD TO MEASURE RESISTANCE THRESHOLDS
Publication number
20080084760
Publication date
Apr 10, 2008
Jonathan R. Fales
G11 - INFORMATION STORAGE