Muthukumaravelu Velayoudame

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Register file circuit design process
- Patent number 9,824,171
- Issue date Nov 21, 2017
- Apple Inc.
- Harsha Krishnamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-bit flip-flop reorganization techniques
- Patent number 9,513,658
- Issue date Dec 6, 2016
- Apple Inc.
- Harsha Krishnamurthy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Activity-driven capacitance reduction to reduce dynamic power consu...
- Patent number 9,292,648
- Issue date Mar 22, 2016
- Apple Inc.
- Amit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan insertion optimization using physical information
- Patent number 8,332,699
- Issue date Dec 11, 2012
- Apple Inc.
- Amit Chandra
- G01 - MEASURING TESTING
Information Patent Grant
Using synthesis to place macros
- Patent number 8,332,798
- Issue date Dec 11, 2012
- Apple Inc.
- Amit Chandra
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
REGISTER FILE CIRCUIT DESIGN PROCESS
- Publication number 20170039299
- Publication date Feb 9, 2017
- Apple Inc.
- Harsha Krishnamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-BIT FLIP-FLOP REORGANIZATION TECHNIQUES
- Publication number 20160266604
- Publication date Sep 15, 2016
- Apple Inc.
- Harsha Krishnamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Activity-Driven Capacitance Reduction to Reduce Dynamic Power Consu...
- Publication number 20160085900
- Publication date Mar 24, 2016
- Apple Inc.
- Amit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Using Synthesis to Place Macros
- Publication number 20120233577
- Publication date Sep 13, 2012
- Amit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan Insertion Optimization Using Physical Information
- Publication number 20110296264
- Publication date Dec 1, 2011
- Amit Chandra
- G01 - MEASURING TESTING