Mutsuhiko Yoshioka

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sheet-like probe, method of producing the probe, and application of...
- Patent number 7,737,707
- Issue date Jun 15, 2010
- JSR Corporation
- Katsumi Sato
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Sheet-like probe, method of producing the probe, and application of...
- Patent number 7,671,609
- Issue date Mar 2, 2010
- JSR Corporation
- Katsumi Sato
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Probe member for wafer inspection, probe card for wafer inspection...
- Patent number 7,656,176
- Issue date Feb 2, 2010
- JSR Corporation
- Mutsuhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Insulation film
- Patent number 7,297,360
- Issue date Nov 20, 2007
- JSR Corporation
- Mutsuhiko Yoshioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stopper for chemical mechanical planarization, method for manufactu...
- Patent number 7,189,651
- Issue date Mar 13, 2007
- JSR Corporation
- Mutsuhiko Yoshioka
- B24 - GRINDING POLISHING
Information Patent Grant
Method of film formation, insulating film, and substrate for semico...
- Patent number 6,890,605
- Issue date May 10, 2005
- JSR Corporation
- Michinori Nishikawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of forming coating film, method of manufacturing semiconduct...
- Patent number 6,645,881
- Issue date Nov 11, 2003
- Kabushiki Kaisha Toshiba
- Nobuhide Yamada
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
PROBE MEMBER FOR WAFER INSPECTION, PROBE CARD FOR WAFER INSPECTION...
- Publication number 20090140756
- Publication date Jun 4, 2009
- JSR Corporation
- Mutsuhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF POSITIONING AN ANISOTROPIC CONDUCTIVE CONNECTOR, METHOD O...
- Publication number 20090015281
- Publication date Jan 15, 2009
- JSR Corporation
- Mutsuhiko Yoshioka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Probe Member for Wafer Inspection, Probe Card for Wafer Inspection...
- Publication number 20070268032
- Publication date Nov 22, 2007
- JSR Corporation
- Mutsuhiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Sheet-Like Probe, Method Of Producing The Probe, And Application Of...
- Publication number 20070205783
- Publication date Sep 6, 2007
- JSR Corporation
- Katsumi Sato
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
STOPPER FOR CHEMICAL MECHANICAL PLANARIZATION, METHOD FOR MANUFACTU...
- Publication number 20070151951
- Publication date Jul 5, 2007
- JSR Corporation
- Mutsuhiko Yoshioka
- B24 - GRINDING POLISHING
Information Patent Application
Biochip and biochip kit, and method of producing the same and metho...
- Publication number 20060252044
- Publication date Nov 9, 2006
- JSR Corporation
- Katsuya Okumura
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Insulation film
- Publication number 20040110896
- Publication date Jun 10, 2004
- JSR Corporation
- Mutsuhiko Yoshioka
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Stopper for chemical mechanical planarization, method for manufactu...
- Publication number 20040110379
- Publication date Jun 10, 2004
- JSR Corporation
- Mutsuhiko Yoshioka
- B24 - GRINDING POLISHING
Information Patent Application
Method of forming coating film, method of manufacturing semiconduct...
- Publication number 20030139063
- Publication date Jul 24, 2003
- Nobuhide Yamada
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of film formation, insulating film, and substrate for semico...
- Publication number 20030059550
- Publication date Mar 27, 2003
- JSR Corporation
- Michinori Nishikawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Mutsuhiko Yoshioka

Person

Patents Grantslast 30 patents

Sheet-like probe, method of producing the probe, and application of...

Sheet-like probe, method of producing the probe, and application of...

Probe member for wafer inspection, probe card for wafer inspection...

Insulation film

Stopper for chemical mechanical planarization, method for manufactu...

Method of film formation, insulating film, and substrate for semico...

Method of forming coating film, method of manufacturing semiconduct...

Patents Applicationslast 30 patents

PROBE MEMBER FOR WAFER INSPECTION, PROBE CARD FOR WAFER INSPECTION...

METHOD OF POSITIONING AN ANISOTROPIC CONDUCTIVE CONNECTOR, METHOD O...

Probe Member for Wafer Inspection, Probe Card for Wafer Inspection...

Sheet-Like Probe, Method Of Producing The Probe, And Application Of...

STOPPER FOR CHEMICAL MECHANICAL PLANARIZATION, METHOD FOR MANUFACTU...

Biochip and biochip kit, and method of producing the same and metho...

Insulation film

Stopper for chemical mechanical planarization, method for manufactu...

Method of forming coating film, method of manufacturing semiconduct...

Method of film formation, insulating film, and substrate for semico...