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MUTSUMI KANO
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TOKYO, JP
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Patents Grants
last 30 patents
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Patent Grant
Test probe for semiconductor devices, method of manufacturing of th...
Patent number
6,888,344
Issue date
May 3, 2005
Mitsubishi Denki Kabushiki Kaisha
Shigeki Maekawa
G01 - MEASURING TESTING
Information
Patent Grant
Test probe for semiconductor devices, method of manufacturing of th...
Patent number
6,646,455
Issue date
Nov 11, 2003
Mitsubishi Denki Kabsuhiki Kaisha
Shigeki Maekawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Test probe for semiconductor devices, method of manufacturing of th...
Publication number
20030090280
Publication date
May 15, 2003
SHIGEKI MAEKAWA
G01 - MEASURING TESTING
Information
Patent Application
TEST PROBE FOR SEMICONDUCTOR DEVICES, METHOD OF MANUFACTURING OF TH...
Publication number
20020097060
Publication date
Jul 25, 2002
SHIGEKI MAEKAWA
G01 - MEASURING TESTING