Mutsuo NISHIKAWA

Person

Matsumoto City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
In-vehicle semiconductor circuit and semiconductor circuit
- Patent number 12,109,958
- Issue date Oct 8, 2024
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Sensor device configured to reduce output errors due to temperature...
- Patent number 11,422,049
- Issue date Aug 23, 2022
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 10,962,430
- Issue date Mar 30, 2021
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensing device
- Patent number 10,393,607
- Issue date Aug 27, 2019
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 10,381,827
- Issue date Aug 13, 2019
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor physical quantity sensor having filter circuits for b...
- Patent number 10,197,464
- Issue date Feb 5, 2019
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor device and method of adjusting physical qu...
- Patent number 10,126,145
- Issue date Nov 13, 2018
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Output value correction method for physical quantity sensor apparat...
- Patent number 9,857,782
- Issue date Jan 2, 2018
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor integrated circuit device having electrically rewrite...
- Patent number 9,666,288
- Issue date May 30, 2017
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit
- Patent number 9,431,065
- Issue date Aug 30, 2016
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device for sensing physical quantity
- Patent number 9,331,684
- Issue date May 3, 2016
- Fuji Electric Co., Ltd.
- Katsuya Karasawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of manufacturing semiconductor device
- Patent number 9,245,851
- Issue date Jan 26, 2016
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor pressure sensor device and method of manufacturing th...
- Patent number 9,200,974
- Issue date Dec 1, 2015
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and semiconductor physical quantit...
- Patent number 8,934,309
- Issue date Jan 13, 2015
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G11 - INFORMATION STORAGE
Information Patent Grant
Physical quantity sensor with son structure, and manufacturing meth...
- Patent number 8,884,385
- Issue date Nov 11, 2014
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor pressure sensor
- Patent number 8,304,847
- Issue date Nov 6, 2012
- Fuji Electric Co., Ltd.
- Toshiaki Kaminaga
- G01 - MEASURING TESTING
Information Patent Grant
Signal amplification circuit
- Patent number 8,237,505
- Issue date Aug 7, 2012
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device having alignment mark and its manufacturing me...
- Patent number 8,183,700
- Issue date May 22, 2012
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal amplifier circuit with a limiting voltage device
- Patent number 7,525,389
- Issue date Apr 28, 2009
- Fuji Electric Device Technology Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Over-voltage protection circuit
- Patent number 7,274,543
- Issue date Sep 25, 2007
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor physical quantity sensing device
- Patent number 7,180,798
- Issue date Feb 20, 2007
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Polysilicon resistor semiconductor device
- Patent number 7,119,657
- Issue date Oct 10, 2006
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Open-circuit failure detection circuit
- Patent number 7,046,013
- Issue date May 16, 2006
- Fuji Electric Co., Ltd.
- Katsuyuki Uematsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor physical quantity sensor with improved noise resistance
- Patent number 6,962,081
- Issue date Nov 8, 2005
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Layout of semiconductor integrated circuit
- Patent number 6,684,371
- Issue date Jan 27, 2004
- Fuji Electric Co., Ltd.
- Katsuyuki Uematsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having an integral protection circuit
- Patent number 6,680,512
- Issue date Jan 20, 2004
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,632,697
- Issue date Oct 14, 2003
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,564,634
- Issue date May 20, 2003
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,526,827
- Issue date Mar 4, 2003
- Fuki Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor chip and method for producing the chip, and se...
- Patent number 6,494,092
- Issue date Dec 17, 2002
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRESSURE DETECTION DEVICE AND MANUFACTURING METHOD
- Publication number 20240011856
- Publication date Jan 11, 2024
- Fuji Electric Co., Ltd.
- Yuichi ITO
- G01 - MEASURING TESTING
Information Patent Application
IN-VEHICLE SEMICONDUCTOR CIRCUIT AND SEMICONDUCTOR CIRCUIT
- Publication number 20220080907
- Publication date Mar 17, 2022
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- B60 - VEHICLES IN GENERAL
Information Patent Application
SENSOR DEVICE
- Publication number 20200182725
- Publication date Jun 11, 2020
- Fuji Electric Co., Ltd.
- Kazuhiro MATSUNAMI
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR
- Publication number 20190187016
- Publication date Jun 20, 2019
- Fuji Electric Co., Ltd.
- Kazuhiro MATSUNAMI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SENSING DEVICE
- Publication number 20170363494
- Publication date Dec 21, 2017
- Fuji Electric Co., Ltd.
- Kazuhiro MATSUNAMI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20170366004
- Publication date Dec 21, 2017
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR PHYSICAL QUANTITY SENSOR DEVICE
- Publication number 20170045407
- Publication date Feb 16, 2017
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING GROUNG WIRING PORTIO...
- Publication number 20170018310
- Publication date Jan 19, 2017
- Fuji Electric Co., Ltd.
- Kazuhiro MATSUNAMI
- G11 - INFORMATION STORAGE
Information Patent Application
PHYSICAL QUANTITY SENSOR DEVICE AND METHOD OF ADJUSTING PHYSICAL QU...
- Publication number 20150303935
- Publication date Oct 22, 2015
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE FOR SENSING PHYSICAL QUANTITY
- Publication number 20150288354
- Publication date Oct 8, 2015
- Fuji Electric Co., Ltd.
- Katsuya KARASAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20150287439
- Publication date Oct 8, 2015
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20150021781
- Publication date Jan 22, 2015
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PRESSURE SENSOR DEVICE AND METHOD OF MANUFACTURING TH...
- Publication number 20150001650
- Publication date Jan 1, 2015
- Fuji Electric Co., Ltd.
- Kazuhiro MATSUNAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OUTPUT VALUE CORRECTION METHOD FOR PHYSICAL QUANTITY SENSOR APPARAT...
- Publication number 20140358317
- Publication date Dec 4, 2014
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR PHYSICAL QUANTIT...
- Publication number 20140330539
- Publication date Nov 6, 2014
- Kazuhiro MATSUNAMI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR PHYSICAL QUANTIT...
- Publication number 20130294171
- Publication date Nov 7, 2013
- Kazuhiro MATSUNAMI
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY SENSOR WITH SON STRUCTURE, AND MANUFACTURING METH...
- Publication number 20130193531
- Publication date Aug 1, 2013
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
Signal amplification circuit
- Publication number 20100097146
- Publication date Apr 22, 2010
- Fuji Electric Systems Co., Ltd.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor Pressure Sensor
- Publication number 20090218643
- Publication date Sep 3, 2009
- Hitach, Ltd.
- Toshiaki Kaminaga
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING ALIGNMENT MARK AND ITS MANUFACTURING ME...
- Publication number 20090032979
- Publication date Feb 5, 2009
- Fuji Electric Device Technology Co., LTD.
- Mutsuo NISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal amplifier circuit
- Publication number 20070290761
- Publication date Dec 20, 2007
- FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device and temperature detection method using the same
- Publication number 20060238186
- Publication date Oct 26, 2006
- Fuji Electric Device Technology Co., LTD.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor physical quantity sensing device
- Publication number 20040027872
- Publication date Feb 12, 2004
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Over-voltage protection circuit
- Publication number 20030214769
- Publication date Nov 20, 2003
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Open-circuit failure detection circuit
- Publication number 20030197513
- Publication date Oct 23, 2003
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Application
Overvoltage protection circuit
- Publication number 20020186518
- Publication date Dec 12, 2002
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having an integral protection circuit
- Publication number 20020175425
- Publication date Nov 28, 2002
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Polysilicon resistor semiconductor device
- Publication number 20020175379
- Publication date Nov 28, 2002
- Katsumichi Ueyanagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor physical quantity sensing device
- Publication number 20020149984
- Publication date Oct 17, 2002
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Layout of semiconductor integrated circuit
- Publication number 20020152448
- Publication date Oct 17, 2002
- Katsuyuki Uematsu
- G06 - COMPUTING CALCULATING COUNTING

Mutsuo NISHIKAWA

Person

Patents Grantslast 30 patents

In-vehicle semiconductor circuit and semiconductor circuit

Sensor device configured to reduce output errors due to temperature...

Pressure sensor

Semiconductor sensing device

Semiconductor integrated circuit device

Semiconductor physical quantity sensor having filter circuits for b...

Physical quantity sensor device and method of adjusting physical qu...

Output value correction method for physical quantity sensor apparat...

Semiconductor integrated circuit device having electrically rewrite...

Semiconductor integrated circuit

Semiconductor device for sensing physical quantity

Semiconductor device and method of manufacturing semiconductor device

Semiconductor pressure sensor device and method of manufacturing th...

Semiconductor integrated circuit and semiconductor physical quantit...

Physical quantity sensor with son structure, and manufacturing meth...

Semiconductor pressure sensor

Signal amplification circuit

Semiconductor device having alignment mark and its manufacturing me...

Signal amplifier circuit with a limiting voltage device

Over-voltage protection circuit

Semiconductor physical quantity sensing device

Polysilicon resistor semiconductor device

Open-circuit failure detection circuit

Semiconductor physical quantity sensor with improved noise resistance

Layout of semiconductor integrated circuit

Semiconductor device having an integral protection circuit

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Semiconductor sensor chip and method for producing the chip, and se...

Patents Applicationslast 30 patents

PRESSURE DETECTION DEVICE AND MANUFACTURING METHOD

IN-VEHICLE SEMICONDUCTOR CIRCUIT AND SEMICONDUCTOR CIRCUIT

SENSOR DEVICE

PRESSURE SENSOR

SEMICONDUCTOR SENSING DEVICE

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

SEMICONDUCTOR PHYSICAL QUANTITY SENSOR DEVICE

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING GROUNG WIRING PORTIO...

PHYSICAL QUANTITY SENSOR DEVICE AND METHOD OF ADJUSTING PHYSICAL QU...

SEMICONDUCTOR DEVICE FOR SENSING PHYSICAL QUANTITY

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR PRESSURE SENSOR DEVICE AND METHOD OF MANUFACTURING TH...

OUTPUT VALUE CORRECTION METHOD FOR PHYSICAL QUANTITY SENSOR APPARAT...

SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR PHYSICAL QUANTIT...

SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR PHYSICAL QUANTIT...

PHYSICAL QUANTITY SENSOR WITH SON STRUCTURE, AND MANUFACTURING METH...

Signal amplification circuit

Semiconductor Pressure Sensor

SEMICONDUCTOR DEVICE HAVING ALIGNMENT MARK AND ITS MANUFACTURING ME...

Signal amplifier circuit

Semiconductor device and temperature detection method using the same

Semiconductor physical quantity sensing device

Over-voltage protection circuit

Open-circuit failure detection circuit

Overvoltage protection circuit

Semiconductor device having an integral protection circuit

Polysilicon resistor semiconductor device

Semiconductor physical quantity sensing device

Layout of semiconductor integrated circuit