Muzammil A. Arain

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Broadband and wide field angle compensator
- Patent number 9,857,292
- Issue date Jan 2, 2018
- KLA-Tencor Corporation
- Lawrence Rotter
- G02 - OPTICS
Information Patent Grant
Broadband and wide field angle compensator
- Patent number 9,519,093
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Lawrence Rotter
- G02 - OPTICS
Information Patent Grant
Systems for providing illumination in optical metrology
- Patent number 9,512,985
- Issue date Dec 6, 2016
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Grant
Multiple angles of incidence semiconductor metrology systems and me...
- Patent number 9,310,290
- Issue date Apr 12, 2016
- KLA-Tencor Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple angles of incidence semiconductor metrology systems and me...
- Patent number 9,116,103
- Issue date Aug 25, 2015
- KLA-Tencor Corporation
- David Y. Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems for Providing Illumination in Optical Metrology
- Publication number 20170146399
- Publication date May 25, 2017
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Application
Broadband And Wide Field Angle Compensator
- Publication number 20170052112
- Publication date Feb 23, 2017
- KLA-Tencor Corporation
- Lawrence Rotter
- G02 - OPTICS
Information Patent Application
MULTIPLE ANGLES OF INCIDENCE SEMICONDUCTOR METROLOGY SYSTEMS AND ME...
- Publication number 20150285735
- Publication date Oct 8, 2015
- KLA-Tencor Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
Broadband And Wide Field Angle Compensator
- Publication number 20150055123
- Publication date Feb 26, 2015
- KLA-Tencor Corporation
- Lawrence Rotter
- G02 - OPTICS
Information Patent Application
MULTIPLE ANGLES OF INCIDENCE SEMICONDUCTOR METROLOGY SYSTEMS AND ME...
- Publication number 20140375981
- Publication date Dec 25, 2014
- KLA-Tencor Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
Systems for Providing Illumination in Optical Metrology
- Publication number 20140240951
- Publication date Aug 28, 2014
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Application
Calibration Of An Optical Metrology System For Critical Dimension A...
- Publication number 20130245985
- Publication date Sep 19, 2013
- KLA-Tencor Corporation
- Klaus Flock
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Muzammil A. Arain

Person

Patents Grantslast 30 patents

Broadband and wide field angle compensator

Broadband and wide field angle compensator

Systems for providing illumination in optical metrology

Multiple angles of incidence semiconductor metrology systems and me...

Multiple angles of incidence semiconductor metrology systems and me...

Patents Applicationslast 30 patents

Systems for Providing Illumination in Optical Metrology

Broadband And Wide Field Angle Compensator

MULTIPLE ANGLES OF INCIDENCE SEMICONDUCTOR METROLOGY SYSTEMS AND ME...

Broadband And Wide Field Angle Compensator

MULTIPLE ANGLES OF INCIDENCE SEMICONDUCTOR METROLOGY SYSTEMS AND ME...

Systems for Providing Illumination in Optical Metrology

Calibration Of An Optical Metrology System For Critical Dimension A...