Myoung Ki AHN

Person

Yongin-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of analyzing lattice strain of semiconductor device
- Patent number 10,410,332
- Issue date Sep 10, 2019
- Samsung Electronics Co., Ltd.
- Myoung-Ki Ahn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Panel inspecting apparatus and method
- Patent number 9,759,665
- Issue date Sep 12, 2017
- Samsung Electronics Co., Ltd.
- Myoung-ki Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Optical module for surface inspection and surface inspection appara...
- Patent number 9,429,525
- Issue date Aug 30, 2016
- Samsung Electronics Co., Ltd.
- Myoung-Ki Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic modulator including composite materials and testing a...
- Patent number 9,429,779
- Issue date Aug 30, 2016
- Samsung Electronics Co., Ltd.
- Chi-youn Chung
- G01 - MEASURING TESTING
Information Patent Grant
Position detector and autofocus control apparatus using focal point...
- Patent number 9,151,962
- Issue date Oct 6, 2015
- Samsung Electronics Co., Ltd.
- Hyun Jae Lee
- G02 - OPTICS
Information Patent Grant
Auto focusing devices for optical microscopes
- Patent number 8,873,138
- Issue date Oct 28, 2014
- Samsung Electronics Co., Ltd.
- Kwang Soo Kim
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ANALYZING LATTICE STRAIN OF SEMICONDUCTOR DEVICE
- Publication number 20180012348
- Publication date Jan 11, 2018
- Samsung Electronics Co., Ltd.
- MYOUNG-KI AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PANEL INSPECTING APPARATUS AND METHOD
- Publication number 20160097726
- Publication date Apr 7, 2016
- Myoung-ki AHN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC MODULATOR INCLUDING COMPOSITE MATERIALS AND TESTING A...
- Publication number 20160054600
- Publication date Feb 25, 2016
- Samsung Electronics Co., Ltd.
- Chi-youn Chung
- G02 - OPTICS
Information Patent Application
OPTICAL MODULE FOR SURFACE INSPECTION AND SURFACE INSPECTION APPARA...
- Publication number 20160047752
- Publication date Feb 18, 2016
- Samsung Electronics Co., Ltd.
- MYOUNG-KI AHN
- G01 - MEASURING TESTING
Information Patent Application
Surface Profile Measurement System
- Publication number 20140198322
- Publication date Jul 17, 2014
- Samsung Electronics Co., Ltd.
- Kwang Soo Kim
- G01 - MEASURING TESTING
Information Patent Application
POSITION DETECTOR AND AUTOFOCUS CONTROL APPARATUS
- Publication number 20130214121
- Publication date Aug 22, 2013
- Samsung Electronics Co., Ltd.
- Hyun Jae LEE
- G02 - OPTICS
Information Patent Application
AUTO FOCUSING DEVICES FOR OPTICAL MICROSCOPES
- Publication number 20130070334
- Publication date Mar 21, 2013
- Samsung Electronics Co., Ltd.
- Kwang Soo KIM
- G02 - OPTICS

Myoung Ki AHN

Person

Patents Grantslast 30 patents

Method of analyzing lattice strain of semiconductor device

Panel inspecting apparatus and method

Optical module for surface inspection and surface inspection appara...

Electro-optic modulator including composite materials and testing a...

Position detector and autofocus control apparatus using focal point...

Auto focusing devices for optical microscopes

Patents Applicationslast 30 patents

METHOD OF ANALYZING LATTICE STRAIN OF SEMICONDUCTOR DEVICE

PANEL INSPECTING APPARATUS AND METHOD

ELECTRO-OPTIC MODULATOR INCLUDING COMPOSITE MATERIALS AND TESTING A...

OPTICAL MODULE FOR SURFACE INSPECTION AND SURFACE INSPECTION APPARA...

Surface Profile Measurement System

POSITION DETECTOR AND AUTOFOCUS CONTROL APPARATUS

AUTO FOCUSING DEVICES FOR OPTICAL MICROSCOPES