Membership
Tour
Register
Log in
Myoungki Ahn
Follow
Person
Yongin-si, KR
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Imaging ellipsometry (IE)-based inspection method and method of fab...
Patent number
11,972,960
Issue date
Apr 30, 2024
Samsung Electronics Co., Ltd.
Myungjun Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system capable of adjusting AOI, AOI spread and azimuth...
Patent number
11,624,699
Issue date
Apr 11, 2023
Samsung Electronics Co., Ltd.
Jaehwang Jung
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT SYSTEM CAPABLE OF ADJUSTING AOI, AOI SPREAD AND AZIMUTH...
Publication number
20210364420
Publication date
Nov 25, 2021
Samsung Electronics Co., Ltd.
Jaehwang JUNG
G01 - MEASURING TESTING
Information
Patent Application
IMAGING ELLIPSOMETRY (IE)-BASED INSPECTION METHOD AND METHOD OF FAB...
Publication number
20210028035
Publication date
Jan 28, 2021
Samsung Electronics Co., Ltd.
Myungjun Lee
G01 - MEASURING TESTING