Myron J. Schneider

Person

Ft Collins, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for non-contact testing and diagnosing of ope...
- Patent number 7,362,106
- Issue date Apr 22, 2008
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method for using internal semiconductor junctions to aid in non-con...
- Patent number 7,327,148
- Issue date Feb 5, 2008
- Agilent Technologies, Inc.
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for engineering a testability interposer for t...
- Patent number 7,307,427
- Issue date Dec 11, 2007
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-contact testing of marginal integrated circuit conne...
- Patent number 7,295,031
- Issue date Nov 13, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method for using internal semiconductor junctions to aid in non-con...
- Patent number 7,242,198
- Issue date Jul 10, 2007
- Agilent Technologies, Inc.
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-contact testing of fixed and inaccessible connection...
- Patent number 7,208,957
- Issue date Apr 24, 2007
- Agilent Technologies, Inc.
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-contact testing and diagnosing electri...
- Patent number 7,123,022
- Issue date Oct 17, 2006
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for engineering a testability interposer for t...
- Publication number 20070018672
- Publication date Jan 25, 2007
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Non-Contact Testing and Diagnosing Electri...
- Publication number 20070007978
- Publication date Jan 11, 2007
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for non-contact testing and diagnosing of ope...
- Publication number 20070001686
- Publication date Jan 4, 2007
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method for using internal semiconductor junctions to aid in non-con...
- Publication number 20070001687
- Publication date Jan 4, 2007
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Application
Method for non-contact testing of fixed and inaccessible connection...
- Publication number 20060197539
- Publication date Sep 7, 2006
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for non-contact testing and diagnosing electri...
- Publication number 20050242824
- Publication date Nov 3, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING

Myron J. Schneider

Person

Patents Grantslast 30 patents

Methods and apparatus for non-contact testing and diagnosing of ope...

Method for using internal semiconductor junctions to aid in non-con...

Method and apparatus for engineering a testability interposer for t...

Method for non-contact testing of marginal integrated circuit conne...

Method for using internal semiconductor junctions to aid in non-con...

Method for non-contact testing of fixed and inaccessible connection...

Method and apparatus for non-contact testing and diagnosing electri...

Patents Applicationslast 30 patents

Method and apparatus for engineering a testability interposer for t...

Method and Apparatus for Non-Contact Testing and Diagnosing Electri...

Methods and apparatus for non-contact testing and diagnosing of ope...

Method for using internal semiconductor junctions to aid in non-con...

Method for non-contact testing of fixed and inaccessible connection...

Method and apparatus for non-contact testing and diagnosing electri...