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Mysore Venkatachalan Ananda
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Shaft cone crown measurement system and methodology
Patent number
7,920,254
Issue date
Apr 5, 2011
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Grant
Sleeve cone quality measurement system and method
Patent number
7,885,786
Issue date
Feb 8, 2011
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Grant
Sapphire alignment fixture
Patent number
7,421,795
Issue date
Sep 9, 2008
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Grant
Sleeve cone angle measurement system
Patent number
7,350,308
Issue date
Apr 1, 2008
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Grant
Shaft cone metrology system and method
Patent number
7,253,889
Issue date
Aug 7, 2007
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Grant
System and method for ECM land erosion metrology
Patent number
6,904,790
Issue date
Jun 14, 2005
Seagate Technology LLC
Mysore Venkatachalan Ananda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SLEEVE CONE QUALITY MEASUREMENT SYSTEM AND METHOD
Publication number
20100094587
Publication date
Apr 15, 2010
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Application
SHAFT CONE CROWN MEASUREMENT SYSTEM AND METHODOLOGY
Publication number
20100094588
Publication date
Apr 15, 2010
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Application
Sapphire alignment fixture
Publication number
20080028627
Publication date
Feb 7, 2008
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Application
Sleeve cone angle measurement system
Publication number
20070137056
Publication date
Jun 21, 2007
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Application
Shaft cone metrology system and method
Publication number
20070139641
Publication date
Jun 21, 2007
Seagate Technology LLC
Ananda V. Mysore
G01 - MEASURING TESTING
Information
Patent Application
System and method for ECM land erosion metrology
Publication number
20040025577
Publication date
Feb 12, 2004
Mysore Venkatachalan Ananda
G01 - MEASURING TESTING