Myungjun Lee

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope device, semiconductor manufacturing de...
- Patent number 12,307,650
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Yunje Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 12,228,499
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor measurement apparatus
- Patent number 12,222,282
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Seoyeon Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Digital holography microscope (DHM), and inspection method and semi...
- Patent number 12,045,009
- Issue date Jul 23, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G02 - OPTICS
Information Patent Grant
Holographic microscope and manufacturing method of semiconductor de...
- Patent number 12,038,718
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology apparatus and method based on diffraction using oblique i...
- Patent number 12,002,698
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Through-focus image-based metrology device, operation method thereo...
- Patent number 11,988,495
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Imaging ellipsometry (IE)-based inspection method and method of fab...
- Patent number 11,972,960
- Issue date Apr 30, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-scale spectral imaging apparatuses and methods, and methods o...
- Patent number 11,726,046
- Issue date Aug 15, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 11,604,136
- Issue date Mar 14, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G02 - OPTICS
Information Patent Grant
Super-resolution holographic microscope
- Patent number 11,428,947
- Issue date Aug 30, 2022
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G01 - MEASURING TESTING
Information Patent Grant
Digital holography microscope (DHM), and inspection method and semi...
- Patent number 11,314,205
- Issue date Apr 26, 2022
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G02 - OPTICS
Information Patent Grant
Inspection apparatus and method based on coherent diffraction imagi...
- Patent number 11,275,034
- Issue date Mar 15, 2022
- Samsung Electronics Co., Ltd.
- Kyungwon Yun
- G01 - MEASURING TESTING
Information Patent Grant
Secondary battery and circuit board assembly suitable for secondary...
- Patent number 9,419,268
- Issue date Aug 16, 2016
- Samsung SDI Co., Ltd.
- Seongjoon Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Lithium rechargeable battery
- Patent number 9,040,192
- Issue date May 26, 2015
- Samsung SDI Co., Ltd.
- Seongjoon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
External case for secondary batteries and secondary battery using t...
- Patent number 7,833,657
- Issue date Nov 16, 2010
- Samsung SDI Co., Ltd.
- Heongsin Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240418645
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Hojun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...
- Publication number 20240353795
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANAGING SEMICONDUCTOR PROCESSING APPARATUS
- Publication number 20240272561
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Junho SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240219315
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Jangwoon Sung
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE MICROSCOPY METROLOGY SYSTEM AND METHOD OF OPERATING FL...
- Publication number 20240212122
- Publication date Jun 27, 2024
- Samsung Electronics Co., Ltd.
- Namyoon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PUPIL IMAGE MEASURING DEVICE AND METHOD
- Publication number 20240167806
- Publication date May 23, 2024
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE ANALYSIS SYSTEM
- Publication number 20240112881
- Publication date Apr 4, 2024
- Samsung Electronics Co., Ltd.
- Jonghyeok PARK
- G01 - MEASURING TESTING
Information Patent Application
FOCUS CONTROL METHOD FOR SPECTROSCOPIC MEASURING APPARATUS, INSPECT...
- Publication number 20240060907
- Publication date Feb 22, 2024
- Samsung Electronics Co., Ltd.
- Youngsun Choi
- G02 - OPTICS
Information Patent Application
IMAGING ELLIPSOMETER AND METHOD OF MEASURING AN OVERLAY ERROR USING...
- Publication number 20230408401
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Jaehyeon Son
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230375463
- Publication date Nov 23, 2023
- Samsung Electronics Co., Ltd.
- Seoyeon JEONG
- G02 - OPTICS
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20230204493
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230186460
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230114817
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- Inho SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE, SEMICONDUCTOR MANUFACTURING DE...
- Publication number 20230074302
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Yunje CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Digital Holography Microscope (DHM), and Inspection Method and Semi...
- Publication number 20220276607
- Publication date Sep 1, 2022
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-SCALE SPECTRAL IMAGING APPARATUSES AND METHODS, AND METHODS O...
- Publication number 20220074867
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20220074848
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METHOD BASED ON DIFFRACTION USING OBLIQUE I...
- Publication number 20220005715
- Publication date Jan 6, 2022
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...
- Publication number 20210396510
- Publication date Dec 23, 2021
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...
- Publication number 20210200148
- Publication date Jul 1, 2021
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- G02 - OPTICS
Information Patent Application
INSPECTION APPARATUS AND METHOD BASED ON COHERENT DIFFRACTION IMAGI...
- Publication number 20210164919
- Publication date Jun 3, 2021
- Samsung Electronics Co., Ltd.
- Kyungwon Yun
- G01 - MEASURING TESTING
Information Patent Application
SUPER-RESOLUTION HOLOGRAPHIC MICROSCOPE
- Publication number 20210080743
- Publication date Mar 18, 2021
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G02 - OPTICS
Information Patent Application
IMAGING ELLIPSOMETRY (IE)-BASED INSPECTION METHOD AND METHOD OF FAB...
- Publication number 20210028035
- Publication date Jan 28, 2021
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G01 - MEASURING TESTING
Information Patent Application
Digital Holography Microscope (DHM), and Inspection Method and Semi...
- Publication number 20190369557
- Publication date Dec 5, 2019
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SECONDARY BATTERY AND CIRCUIT BOARD ASSEMBLY SUITABLE FOR SECONDARY...
- Publication number 20110123838
- Publication date May 26, 2011
- Samsung SDI Co., Ltd.
- Seongjoon Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LITHIUM RECHARGEABLE BATTERY
- Publication number 20090246620
- Publication date Oct 1, 2009
- Samsung SDI Co., Ltd
- Seongjoon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
External case for secondary batteries and secondary battery using t...
- Publication number 20080166628
- Publication date Jul 10, 2008
- Heongsin Kim
- H01 - BASIC ELECTRIC ELEMENTS

Myungjun Lee

Person

Patents Grantslast 30 patents

Scanning electron microscope device, semiconductor manufacturing de...

Pupil ellipsometry measurement apparatus and method and method of f...

Semiconductor measurement apparatus

Digital holography microscope (DHM), and inspection method and semi...

Holographic microscope and manufacturing method of semiconductor de...

Metrology apparatus and method based on diffraction using oblique i...

Through-focus image-based metrology device, operation method thereo...

Imaging ellipsometry (IE)-based inspection method and method of fab...

Multi-scale spectral imaging apparatuses and methods, and methods o...

Pupil ellipsometry measurement apparatus and method and method of f...

Super-resolution holographic microscope

Digital holography microscope (DHM), and inspection method and semi...

Inspection apparatus and method based on coherent diffraction imagi...

Secondary battery and circuit board assembly suitable for secondary...

Lithium rechargeable battery

External case for secondary batteries and secondary battery using t...

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT APPARATUS

HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...

METHOD OF MANAGING SEMICONDUCTOR PROCESSING APPARATUS

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

FLUORESCENCE MICROSCOPY METROLOGY SYSTEM AND METHOD OF OPERATING FL...

PUPIL IMAGE MEASURING DEVICE AND METHOD

SUBSTRATE ANALYSIS SYSTEM

FOCUS CONTROL METHOD FOR SPECTROSCOPIC MEASURING APPARATUS, INSPECT...

IMAGING ELLIPSOMETER AND METHOD OF MEASURING AN OVERLAY ERROR USING...

SEMICONDUCTOR MEASUREMENT APPARATUS

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

SCANNING ELECTRON MICROSCOPE DEVICE, SEMICONDUCTOR MANUFACTURING DE...

Digital Holography Microscope (DHM), and Inspection Method and Semi...

MULTI-SCALE SPECTRAL IMAGING APPARATUSES AND METHODS, AND METHODS O...

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

METROLOGY APPARATUS AND METHOD BASED ON DIFFRACTION USING OBLIQUE I...

THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...

HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...

INSPECTION APPARATUS AND METHOD BASED ON COHERENT DIFFRACTION IMAGI...

SUPER-RESOLUTION HOLOGRAPHIC MICROSCOPE

IMAGING ELLIPSOMETRY (IE)-BASED INSPECTION METHOD AND METHOD OF FAB...

Digital Holography Microscope (DHM), and Inspection Method and Semi...

SECONDARY BATTERY AND CIRCUIT BOARD ASSEMBLY SUITABLE FOR SECONDARY...

LITHIUM RECHARGEABLE BATTERY

External case for secondary batteries and secondary battery using t...