N. William Parker

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
High aspect ratio X-ray targets and uses of same
- Patent number 10,366,860
- Issue date Jul 30, 2019
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope with multiple types of integrated x-ray detecto...
- Patent number 9,972,474
- Issue date May 15, 2018
- FEI Company
- Cornelis van Beek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High aspect ratio x-ray targets and uses of same
- Patent number 9,934,930
- Issue date Apr 3, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Chicane blanker assemblies for charged particle beam systems and me...
- Patent number 9,767,984
- Issue date Sep 19, 2017
- Kevin Kagarice
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lamella creation method and device using fixed-angle beam and rotat...
- Patent number 9,733,164
- Issue date Aug 15, 2017
- FEI Company
- Andrew B. Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi species ion source
- Patent number 9,627,174
- Issue date Apr 18, 2017
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage isolation of an inductively coupled plasma ion source...
- Patent number 9,591,735
- Issue date Mar 7, 2017
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for simultaneous detection of secondary electrons...
- Patent number 9,494,516
- Issue date Nov 15, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated light optics and gas delivery in a charged particle lens
- Patent number 9,478,390
- Issue date Oct 25, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle lens that transmits emissions from sample
- Patent number 9,349,564
- Issue date May 24, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi species ion source
- Patent number 9,224,569
- Issue date Dec 29, 2015
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image-enhancing spotlight mode for digital microscopy
- Patent number 9,204,036
- Issue date Dec 1, 2015
- FEI Company
- Alan Bahm
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and structures for rapid switching between different proces...
- Patent number 9,159,534
- Issue date Oct 13, 2015
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy filter
- Patent number 9,111,715
- Issue date Aug 18, 2015
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for attachment of an electrode into a plasma source
- Patent number 9,053,895
- Issue date Jun 9, 2015
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for simultaneous detection of secondary electrons...
- Patent number 9,040,909
- Issue date May 26, 2015
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Encapsulation of electrodes in solid media
- Patent number 8,987,678
- Issue date Mar 24, 2015
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for attachment of an electrode into an inductively coupled p...
- Patent number 8,928,210
- Issue date Jan 6, 2015
- FEI Comapny
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system aperture
- Patent number 8,907,296
- Issue date Dec 9, 2014
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
On-axis detector for charged particle beam system
- Patent number 8,759,764
- Issue date Jun 24, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source with multiple selectable particle emitters
- Patent number 8,710,453
- Issue date Apr 29, 2014
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Encapsulation of electrodes in solid media for use in conjunction w...
- Patent number 8,642,974
- Issue date Feb 4, 2014
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and structures for rapid switching between different proces...
- Patent number 8,633,452
- Issue date Jan 21, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for localization of large numbers of fluorescent...
- Patent number 8,319,181
- Issue date Nov 27, 2012
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Combination laser and charged particle beam system
- Patent number 8,314,410
- Issue date Nov 20, 2012
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide aperature wien ExB mass filter
- Patent number 8,294,093
- Issue date Oct 23, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-corrected wien ExB mass filter with removal of neutrals...
- Patent number 8,283,629
- Issue date Oct 9, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20180190467
- Publication date Jul 5, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ELECTRON MICROSCOPE WITH MULTIPE TYPES OF INTEGRATED X-RAY DETECTOR...
- Publication number 20180033589
- Publication date Feb 1, 2018
- FEI Company
- Frederick H. Schamber
- G01 - MEASURING TESTING
Information Patent Application
MULTI SPECIES ION SOURCE
- Publication number 20160104599
- Publication date Apr 14, 2016
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chicane Blanker Assemblies for Charged Particle Beam Systems and Me...
- Publication number 20160093470
- Publication date Mar 31, 2016
- FEI Company
- Kevin Kagarice
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUNCTIONALIZED GRIDS FOR LOCATING AND IMAGING BIOLOGICAL SPECIMENS...
- Publication number 20160032281
- Publication date Feb 4, 2016
- FEI Company
- Mark Utlaut
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Charged-Particle Lens that Transmits Emissions from Sample
- Publication number 20160020062
- Publication date Jan 21, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS
- Publication number 20150380205
- Publication date Dec 31, 2015
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20150303021
- Publication date Oct 22, 2015
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
High Voltage Isolation of an Inductively Coupled Plasma Ion Source...
- Publication number 20150102230
- Publication date Apr 16, 2015
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods and Structures for Rapid Switching Between Different Proces...
- Publication number 20140306607
- Publication date Oct 16, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...
- Publication number 20140131573
- Publication date May 15, 2014
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
On-Axis Detector for Charged Particle Beam System
- Publication number 20140001357
- Publication date Jan 2, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi Species Ion Source
- Publication number 20140001372
- Publication date Jan 2, 2014
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lamella creation method and device using fixed-angle beam and rotat...
- Publication number 20130328246
- Publication date Dec 12, 2013
- FEI Company
- Andrew B. Wells
- G01 - MEASURING TESTING
Information Patent Application
Image-Enhancing Spotlight Mode for Digital Microscopy
- Publication number 20130307960
- Publication date Nov 21, 2013
- FEI Company
- Alan Bahm
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Actively Monitoring an Inductively-Coupled...
- Publication number 20130250293
- Publication date Sep 26, 2013
- FEI Company
- Mark W. Utlaut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System Aperture
- Publication number 20130181140
- Publication date Jul 18, 2013
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
System for Attachment of an Electrode into an Inductively Coupled P...
- Publication number 20130134855
- Publication date May 30, 2013
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ENERGY FILTER
- Publication number 20130112890
- Publication date May 9, 2013
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Structures for Rapid Switching Between Different Proces...
- Publication number 20130015765
- Publication date Jan 17, 2013
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Encapsulation of Electrodes in Solid Media for use in conjunction w...
- Publication number 20120261587
- Publication date Oct 18, 2012
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
WIDE APERATURE WIEN EXB MASS FILTER
- Publication number 20120261565
- Publication date Oct 18, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION-CORRECTED WIEN EXB MASS FILTER WITH REMOVAL OF NEUTRALS...
- Publication number 20120261566
- Publication date Oct 18, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Localization of Large Numbers of Fluorescent...
- Publication number 20120193530
- Publication date Aug 2, 2012
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Source with Multiple Selectable Particle Emitters
- Publication number 20120168638
- Publication date Jul 5, 2012
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Encapsulation of Electrodes in Solid Media for use in conjunction w...
- Publication number 20110272592
- Publication date Nov 10, 2011
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Combination Laser and Charged Particle Beam System
- Publication number 20110248164
- Publication date Oct 13, 2011
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS

N. William Parker

Person

Patents Grantslast 30 patents

High aspect ratio X-ray targets and uses of same

Electron microscope with multiple types of integrated x-ray detecto...

High aspect ratio x-ray targets and uses of same

Chicane blanker assemblies for charged particle beam systems and me...

Lamella creation method and device using fixed-angle beam and rotat...

Multi species ion source

High voltage isolation of an inductively coupled plasma ion source...

System and method for simultaneous detection of secondary electrons...

Integrated light optics and gas delivery in a charged particle lens

Charged-particle lens that transmits emissions from sample

Multi species ion source

Image-enhancing spotlight mode for digital microscopy

Methods and structures for rapid switching between different proces...

Charged particle energy filter

System for attachment of an electrode into a plasma source

System and method for simultaneous detection of secondary electrons...

Encapsulation of electrodes in solid media

System for attachment of an electrode into an inductively coupled p...

Charged particle beam system aperture

On-axis detector for charged particle beam system

Charged particle source with multiple selectable particle emitters

Encapsulation of electrodes in solid media for use in conjunction w...

Methods and structures for rapid switching between different proces...

System and method for localization of large numbers of fluorescent...

Combination laser and charged particle beam system

Wide aperature wien ExB mass filter

Aberration-corrected wien ExB mass filter with removal of neutrals...

Patents Applicationslast 30 patents

HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME

ELECTRON MICROSCOPE WITH MULTIPE TYPES OF INTEGRATED X-RAY DETECTOR...

MULTI SPECIES ION SOURCE

Chicane Blanker Assemblies for Charged Particle Beam Systems and Me...

FUNCTIONALIZED GRIDS FOR LOCATING AND IMAGING BIOLOGICAL SPECIMENS...

Charged-Particle Lens that Transmits Emissions from Sample

INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS

HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME

High Voltage Isolation of an Inductively Coupled Plasma Ion Source...

Methods and Structures for Rapid Switching Between Different Proces...

SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...

On-Axis Detector for Charged Particle Beam System

Multi Species Ion Source

Lamella creation method and device using fixed-angle beam and rotat...

Image-Enhancing Spotlight Mode for Digital Microscopy

Method and Apparatus for Actively Monitoring an Inductively-Coupled...

Charged Particle Beam System Aperture

System for Attachment of an Electrode into an Inductively Coupled P...

CHARGED PARTICLE ENERGY FILTER

Methods and Structures for Rapid Switching Between Different Proces...

Encapsulation of Electrodes in Solid Media for use in conjunction w...

WIDE APERATURE WIEN EXB MASS FILTER

ABERRATION-CORRECTED WIEN EXB MASS FILTER WITH REMOVAL OF NEUTRALS...

System and Method for Localization of Large Numbers of Fluorescent...

Charged Particle Source with Multiple Selectable Particle Emitters

Encapsulation of Electrodes in Solid Media for use in conjunction w...

Combination Laser and Charged Particle Beam System