Nabil Badereddine

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Grasse, FR

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Patents Grantslast 30 patents

Information Patent Grant
Design-for-test apparatuses and techniques
- Patent number 9,595,316
- Issue date Mar 14, 2017
- Intel IP Corporation
- Vianney Choserot
- G11 - INFORMATION STORAGE
Information Patent Grant
Assist circuits for SRAM testing
- Patent number 9,418,759
- Issue date Aug 16, 2016
- Intel IP Corporation
- Nabil Badereddine
- G11 - INFORMATION STORAGE
Information Patent Grant
For-test apparatuses and techniques
- Patent number 9,236,144
- Issue date Jan 12, 2016
- Intel IP Corporation
- Vianney Choserot
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit arrangement, a method for testing a supply voltage provided...
- Patent number 9,147,498
- Issue date Sep 29, 2015
- INTEL DEUTSCHLAND GMBH
- Leonardo Henrique Bonet Zordan
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DESIGN-FOR-TEST APPARATUSES AND TECHNIQUES
- Publication number 20160078927
- Publication date Mar 17, 2016
- Intel IP Corporation
- Vianney Choserot
- G11 - INFORMATION STORAGE
Information Patent Application
ASSIST CIRCUITS FOR SRAM TESTING
- Publication number 20150325313
- Publication date Nov 12, 2015
- Nabil Badereddine
- G11 - INFORMATION STORAGE
Information Patent Application
DESIGN-FOR-TEST APPARATUSES AND TECHNIQUES
- Publication number 20150262707
- Publication date Sep 17, 2015
- Vianney Choserot
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT ARRANGEMENT, A METHOD FOR TESTING A SUPPLY VOLTAGE PROVIDED...
- Publication number 20140307515
- Publication date Oct 16, 2014
- Leonardo Henrique Bonet Zordan
- G11 - INFORMATION STORAGE