Nadav Haas

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Merkaz-Shapira, IL

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Patents Grantslast 30 patents

Information Patent Grant
Detecting system for detecting distant objects
- Patent number 11,525,895
- Issue date Dec 13, 2022
- Eyal Yatskan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for the examination of specimen
- Patent number 7,800,062
- Issue date Sep 21, 2010
- Applied Materials, Inc.
- Alex Goldenshtein
- G01 - MEASURING TESTING
Information Patent Grant
Beam evaluation
- Patent number 6,545,275
- Issue date Apr 8, 2003
- Applied Materials, Inc.
- Asher Pearl
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DETECTING SYSTEM FOR DETECTING DISTANT OBJECTS
- Publication number 20190204422
- Publication date Jul 4, 2019
- NewSight Imaging Ltd.
- Eyal YATSKAN
- G01 - MEASURING TESTING
Information Patent Application
Detection of imperfections in precious stones
- Publication number 20050117145
- Publication date Jun 2, 2005
- Joshua Altman
- G01 - MEASURING TESTING
Information Patent Application
Method and system for the examination of specimen
- Publication number 20050116164
- Publication date Jun 2, 2005
- Alex Goldenshtein
- G01 - MEASURING TESTING