Nadav Wertsman

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Ein Hod, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for correcting errors on a wafer processed by...
- Patent number 10,061,192
- Issue date Aug 28, 2018
- Carl Zeiss SMT GmbH
- Dirk Beyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for correcting errors on a wafer processed by...
- Patent number 9,436,080
- Issue date Sep 6, 2016
- Carl Zeiss SMS GmbH
- Dirk Beyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR CORRECTING ERRORS ON A WAFER PROCESSED BY...
- Publication number 20160342080
- Publication date Nov 24, 2016
- Carl Zeiss SMT GMBH
- Dirk Beyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR CORRECTING ERRORS ON A WAFER PROCESSED BY...
- Publication number 20140036243
- Publication date Feb 6, 2014
- CARL ZEISS SMS LTD.
- Dirk Beyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR DETECTING CRITICAL DEFECTS
- Publication number 20090273669
- Publication date Nov 5, 2009
- Nadav WERTSMAN
- G06 - COMPUTING CALCULATING COUNTING