Nadya Strelkova

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Gresham, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and computer program product for detecting potential failure...
- Patent number 7,434,198
- Issue date Oct 7, 2008
- LSI Logic Corporation
- Nadya Strelkova
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for analyzing the quality of an OPC mask
- Patent number 7,340,706
- Issue date Mar 4, 2008
- LSI Logic Corporation
- Ilya Golubtsov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for verifying the post-optical proximity corre...
- Patent number 7,325,222
- Issue date Jan 29, 2008
- LSI Logic Corporation
- Nadya G. Strelkova
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Quality measurement of an aerial image
- Patent number 7,035,446
- Issue date Apr 25, 2006
- LSI Logic Corporation
- Marina M. Medvedeva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device parameter and gate performance simulation based on wafer ima...
- Patent number 6,775,818
- Issue date Aug 10, 2004
- LSI Logic Corporation
- Kunal Taravade
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and computer program product for detecting potential failure...
- Publication number 20070157152
- Publication date Jul 5, 2007
- LSI Logic Corporation
- Nadya Strelkova
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for analyzing the quality of an OPC mask
- Publication number 20070079277
- Publication date Apr 5, 2007
- Ilya Golubtsov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for verifying ret latent image sensitivity to mask manufactu...
- Publication number 20050204328
- Publication date Sep 15, 2005
- Nadya G. Strelkova
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Device parameter and gate performance simulation based on wafer ima...
- Publication number 20040040000
- Publication date Feb 26, 2004
- Kunal Taravade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Quality measurement of an aerial image
- Publication number 20030219154
- Publication date Nov 27, 2003
- Marina M. Medvedeva
- G06 - COMPUTING CALCULATING COUNTING