Naganobu Aoki

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Matsumoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Selection method, positioning device and program
- Patent number 10,120,081
- Issue date Nov 6, 2018
- Seiko Epson Corporation
- Naoki Gobara
- G01 - MEASURING TESTING
Information Patent Grant
Location calculating method and location calculating device
- Patent number 9,285,483
- Issue date Mar 15, 2016
- Seiko Epson Corporation
- Naganobu Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Location calculating method and location calculating device
- Patent number 8,552,909
- Issue date Oct 8, 2013
- Seiko Epson Corporation
- Naganobu Aoki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SELECTION METHOD, POSITIONING DEVICE AND PROGRAM
- Publication number 20160223680
- Publication date Aug 4, 2016
- SEIKO EPSON CORPORATION
- Naoki GOBARA
- G01 - MEASURING TESTING
Information Patent Application
Location Calculating Method and Location Calculating Device
- Publication number 20130342392
- Publication date Dec 26, 2013
- SEIKO EPSON CORPORATION
- Naganobu Aoki
- G01 - MEASURING TESTING
Information Patent Application
LOCATION CALCULATING METHOD AND LOCATION CALCULATING DEVICE
- Publication number 20110248885
- Publication date Oct 13, 2011
- SEIKO EPSON CORPORATION
- Naganobu Aoki
- G01 - MEASURING TESTING