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Nagaraja P. Rao
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San Carlos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical method and apparatus for inspecting large area planar objects
Patent number
6,809,809
Issue date
Oct 26, 2004
Real Time Metrology, Inc.
Patrick D. Kinney
G01 - MEASURING TESTING
Information
Patent Grant
Optical method and apparatus for inspecting large area planar objects
Patent number
6,630,996
Issue date
Oct 7, 2003
Real Time Metrology, Inc.
Nagaraja P. Rao
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for selectively marking a semiconductor wafer
Patent number
6,122,562
Issue date
Sep 19, 2000
Applied Materials, Inc.
Patrick D. Kinney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical inspection module and method for detecting particles and de...
Patent number
5,909,276
Issue date
Jun 1, 1999
MicroTherm, LLC
Patrick D. Kinney
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for high-efficiency, in-situ particle detection
Patent number
5,481,357
Issue date
Jan 2, 1996
International Business Machines Corporation
Aziz M. Ahsan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Optical method and apparatus for inspecting large area planar objects
Publication number
20040012775
Publication date
Jan 22, 2004
Patrick D. Kinney
G01 - MEASURING TESTING
Information
Patent Application
Optical method and apparatus for inspecting large area planar objects
Publication number
20020088952
Publication date
Jul 11, 2002
Nagaraja P. Rao
G01 - MEASURING TESTING