Nagel MICHAEL

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Aachen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Probe for detecting near field and near-field detection system incl...
- Patent number 11,579,167
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Jongmin Yoon
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ PROBE
- Publication number 20230417820
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTION SYSTEM INCL...
- Publication number 20220082584
- Publication date Mar 17, 2022
- Samsung Electronics Co., Ltd.
- Jongmin YOON
- G01 - MEASURING TESTING