Nai-Ren Hsu

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Taipei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Testing device for an electronic device having two pivot points
- Patent number 8,302,488
- Issue date Nov 6, 2012
- Inventec Corporation
- Nai-Ren Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and limiting switch thereof
- Patent number 8,286,500
- Issue date Oct 16, 2012
- Inventec Corporation
- Nai-Ren Hsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING DEVICE
- Publication number 20110247428
- Publication date Oct 13, 2011
- Inventec Corporation
- Nai-Ren Hsu
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND LIMITING SWITCH THEREOF
- Publication number 20110239776
- Publication date Oct 6, 2011
- Inventec Corporation
- Nai-Ren Hsu
- G01 - MEASURING TESTING