Nai-Wen CHENG

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Broadband wafer defect detection
- Patent number 12,158,434
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Analog cells utilizing complementary mosfet pairs
- Patent number 12,073,167
- Issue date Aug 27, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Ting Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for selecting clock frequency in master device of...
- Patent number 12,072,729
- Issue date Aug 27, 2024
- Nuvoton Technology Corporation
- Nai-Wen Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion implantation gas supply system
- Patent number 11,961,707
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsing-Piao Hsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 11,908,700
- Issue date Feb 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broadband wafer defect detection
- Patent number 11,852,593
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Ion through-substrate via
- Patent number 11,646,247
- Issue date May 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Yang Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analog cells utilizing complementary mosfet pairs
- Patent number 11,574,104
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Ting Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor packaging device comprising a shield structure
- Patent number 11,552,027
- Issue date Jan 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Yu Chien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation gas supply system
- Patent number 11,527,382
- Issue date Dec 13, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsing-Piao Hsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 11,482,422
- Issue date Oct 25, 2022
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Storage devices mapped to registers and mapping methods thereof
- Patent number 11,321,091
- Issue date May 3, 2022
- Nuvoton Technology Corporation
- Nai-Wen Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion implantation system and source bushing thereof
- Patent number 11,282,673
- Issue date Mar 22, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ying-Chieh Meng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion impantation gas supply system
- Patent number 11,081,315
- Issue date Aug 3, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsing-Piao Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D IC bump height metrology APC
- Patent number 11,075,097
- Issue date Jul 27, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broadband wafer defect detection
- Patent number 11,060,980
- Issue date Jul 13, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor packaging device comprising a shield structure
- Patent number 11,037,885
- Issue date Jun 15, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Yu Chien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bandgap reference circuit, control circuit, and associated control...
- Patent number 10,877,505
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Nai Chen Cheng
- G05 - CONTROLLING REGULATING
Information Patent Grant
Analog cells utilizing complementary mosfet pairs
- Patent number 10,878,160
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Ting Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion through-substrate via
- Patent number 10,867,891
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Yang Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation system and source bushing thereof
- Patent number 10,784,079
- Issue date Sep 22, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ying-Chieh Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor manufacturing apparatus and method thereof
- Patent number 10,763,117
- Issue date Sep 1, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bandgap reference circuit, control circuit, and associated control...
- Patent number 10,649,482
- Issue date May 12, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Nai Chen Cheng
- G05 - CONTROLLING REGULATING
Information Patent Grant
3D IC bump height metrology APC
- Patent number 10,541,164
- Issue date Jan 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap reference circuit, control circuit, and associated method t...
- Patent number 10,345,847
- Issue date Jul 9, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Nai Chen Cheng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Ion beam source for semiconductor ion implantation
- Patent number 10,269,530
- Issue date Apr 23, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsing-Piao Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D IC bump height metrology APC
- Patent number 10,181,415
- Issue date Jan 15, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor with low step height between back-side metal and pixel...
- Patent number 10,074,680
- Issue date Sep 11, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hsien Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection and repairing method and associated system and no...
- Patent number 9,929,045
- Issue date Mar 27, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Nai-Han Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer processing system using multi-zone chuck
- Patent number 9,892,954
- Issue date Feb 13, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd
- Nai-Han Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
ANTI-SLIP COMPOSITIONS AND COMPONENTS FOR SEMICONDUCTOR WAFER HANDL...
- Publication number 20250237944
- Publication date Jul 24, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Chung-Ming Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONTROL OF ENVIRONMENT WITHIN PROCESSING MODULES
- Publication number 20240153787
- Publication date May 9, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jhih-Yu Li
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
BROADBAND WAFER DEFECT DETECTION
- Publication number 20240068957
- Publication date Feb 29, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Nai-Han CHENG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR SELECTING CLOCK FREQUENCY IN MASTER DEVICE OF...
- Publication number 20230341887
- Publication date Oct 26, 2023
- NUVOTON TECHNOLOGY CORPORATION
- NAI-WEN CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALOG CELLS UTILIZING COMPLEMENTARY MOSFET PAIRS
- Publication number 20230186008
- Publication date Jun 15, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Ting LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION IMPLANTATION GAS SUPPLY SYSTEM
- Publication number 20230113582
- Publication date Apr 13, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsing-Piao HSU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20220367197
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- NAI-HAN CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BROADBAND WAFER DEFECT DETECTION
- Publication number 20210333220
- Publication date Oct 28, 2021
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Nai-Han CHENG
- G01 - MEASURING TESTING
Information Patent Application
ION IMPLANTATION GAS SUPPLY SYSTEM
- Publication number 20210319978
- Publication date Oct 14, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsing-Piao HSU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR PACKAGING DEVICE COMPRISING A SHIELD STRUCTURE
- Publication number 20210296258
- Publication date Sep 23, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Yu Chien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALOG CELLS UTILIZING COMPLEMENTARY MOSFET PAIRS
- Publication number 20210224459
- Publication date Jul 22, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Ting LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICES MAPPED TO REGISTERS AND MAPPING METHODS THEREOF
- Publication number 20210124584
- Publication date Apr 29, 2021
- NUVOTON TECHNOLOGY CORPORATION
- Nai-Wen CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION THROUGH-SUBSTRATE VIA
- Publication number 20210082787
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Yang Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGING DEVICE COMPRISING A SHIELD STRUCTURE
- Publication number 20210050303
- Publication date Feb 18, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Wei-Yu Chien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
- Publication number 20200402806
- Publication date Dec 24, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- NAI-HAN CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPANTATION GAS SUPPLY SYSTEM
- Publication number 20200395193
- Publication date Dec 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsing-Piao HSU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION IMPLANTATION SYSTEM AND SOURCE BUSHING THEREOF
- Publication number 20200381210
- Publication date Dec 3, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ying-Chieh MENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
BANDGAP REFERENCE CIRCUIT, CONTROL CIRCUIT, AND ASSOCIATED CONTROL...
- Publication number 20200257326
- Publication date Aug 13, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- NAI CHEN CHENG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
3D IC BUMP HEIGHT METROLOGY APC
- Publication number 20200152495
- Publication date May 14, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION THROUGH-SUBSTRATE VIA
- Publication number 20200135617
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Yang Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BANDGAP REFERENCE CIRCUIT, CONTROL CIRCUIT, AND ASSOCIATED CONTROL...
- Publication number 20200125128
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- NAI CHEN CHENG
- G05 - CONTROLLING REGULATING
Information Patent Application
ION IMPLANTATION SYSTEM AND SOURCE BUSHING THEREOF
- Publication number 20200098544
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ying-Chieh MENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
BROADBAND WAFER DEFECT DETECTION
- Publication number 20190162676
- Publication date May 30, 2019
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Nai-Han CHENG
- G01 - MEASURING TESTING
Information Patent Application
3D IC BUMP HEIGHT METROLOGY APC
- Publication number 20190139800
- Publication date May 9, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD THEREOF
- Publication number 20180166291
- Publication date Jun 14, 2018
- Taiwan Semiconductor Manufacturing company Ltd.
- NAI-HAN CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D IC BUMP HEIGHT METROLOGY APC
- Publication number 20180096872
- Publication date Apr 5, 2018
- Taiwan Semiconductor Manufacturing Co., LTD
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION AND REPAIRING METHOD AND ASSOCIATED SYSTEM AND NO...
- Publication number 20180019166
- Publication date Jan 18, 2018
- Taiwan Semiconductor Manufacturing company Ltd.
- NAI-HAN CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D IC BUMP HEIGHT METROLOGY APC
- Publication number 20170018445
- Publication date Jan 19, 2017
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Application
Image Sensor with Low Step Height between Back-side Metal and Pixel...
- Publication number 20160190190
- Publication date Jun 30, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hsien Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITANCE PHASE INTERPOLATION CIRCUIT AND METHOD THEREOF, AND MUL...
- Publication number 20150365071
- Publication date Dec 17, 2015
- Industrial Technology Research Institute
- Chih-Hsiang Chang
- H01 - BASIC ELECTRIC ELEMENTS

Nai-Wen CHENG

Person

Patents Grantslast 30 patents

Broadband wafer defect detection

Analog cells utilizing complementary mosfet pairs

Device and method for selecting clock frequency in master device of...

Ion implantation gas supply system

Method for manufacturing semiconductor structure

Broadband wafer defect detection

Ion through-substrate via

Analog cells utilizing complementary mosfet pairs

Semiconductor packaging device comprising a shield structure

Ion implantation gas supply system

Method for manufacturing semiconductor structure

Storage devices mapped to registers and mapping methods thereof

Ion implantation system and source bushing thereof

Ion impantation gas supply system

3D IC bump height metrology APC

Broadband wafer defect detection

Semiconductor packaging device comprising a shield structure

Bandgap reference circuit, control circuit, and associated control...

Analog cells utilizing complementary mosfet pairs

Ion through-substrate via

Ion implantation system and source bushing thereof

Semiconductor manufacturing apparatus and method thereof

Bandgap reference circuit, control circuit, and associated control...

3D IC bump height metrology APC

Bandgap reference circuit, control circuit, and associated method t...

Ion beam source for semiconductor ion implantation

3D IC bump height metrology APC

Image sensor with low step height between back-side metal and pixel...

Defect inspection and repairing method and associated system and no...

Wafer processing system using multi-zone chuck

Patents Applicationslast 30 patents

ANTI-SLIP COMPOSITIONS AND COMPONENTS FOR SEMICONDUCTOR WAFER HANDL...

CONTROL OF ENVIRONMENT WITHIN PROCESSING MODULES

BROADBAND WAFER DEFECT DETECTION

DEVICE AND METHOD FOR SELECTING CLOCK FREQUENCY IN MASTER DEVICE OF...

ANALOG CELLS UTILIZING COMPLEMENTARY MOSFET PAIRS

ION IMPLANTATION GAS SUPPLY SYSTEM

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

BROADBAND WAFER DEFECT DETECTION

ION IMPLANTATION GAS SUPPLY SYSTEM

SEMICONDUCTOR PACKAGING DEVICE COMPRISING A SHIELD STRUCTURE

ANALOG CELLS UTILIZING COMPLEMENTARY MOSFET PAIRS

STORAGE DEVICES MAPPED TO REGISTERS AND MAPPING METHODS THEREOF

ION THROUGH-SUBSTRATE VIA

SEMICONDUCTOR PACKAGING DEVICE COMPRISING A SHIELD STRUCTURE

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE

ION IMPANTATION GAS SUPPLY SYSTEM

ION IMPLANTATION SYSTEM AND SOURCE BUSHING THEREOF

BANDGAP REFERENCE CIRCUIT, CONTROL CIRCUIT, AND ASSOCIATED CONTROL...

3D IC BUMP HEIGHT METROLOGY APC

ION THROUGH-SUBSTRATE VIA

BANDGAP REFERENCE CIRCUIT, CONTROL CIRCUIT, AND ASSOCIATED CONTROL...

ION IMPLANTATION SYSTEM AND SOURCE BUSHING THEREOF

BROADBAND WAFER DEFECT DETECTION

3D IC BUMP HEIGHT METROLOGY APC

SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD THEREOF

3D IC BUMP HEIGHT METROLOGY APC

DEFECT INSPECTION AND REPAIRING METHOD AND ASSOCIATED SYSTEM AND NO...

3D IC BUMP HEIGHT METROLOGY APC

Image Sensor with Low Step Height between Back-side Metal and Pixel...

CAPACITANCE PHASE INTERPOLATION CIRCUIT AND METHOD THEREOF, AND MUL...