Naifeng Bian

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Internal calibration mechanism for a weigh module
- Patent number 11,933,663
- Issue date Mar 19, 2024
- Mettler Toledo Instrument (Shanghai) Company Limited
- Baohui Liu
- G01 - MEASURING TESTING
Information Patent Grant
Weighing sensor and lever
- Patent number 11,366,005
- Issue date Jun 21, 2022
- Mettler Toledo Instrument (Shanghai) Company Limited
- Chao Wu
- G01 - MEASURING TESTING
Information Patent Grant
Load cell with streamlined structure and overload protection
- Patent number 10,612,965
- Issue date Apr 7, 2020
- Mettler-Toledo GmbH
- Chun Yang
- G01 - MEASURING TESTING
Information Patent Grant
Weigh module with parallel-guiding mechanism module
- Patent number 10,156,470
- Issue date Dec 18, 2018
- Mettler-Toledo GmbH
- Chun Yang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERNAL CALIBRATION MECHANISM FOR A WEIGH MODULE
- Publication number 20210199491
- Publication date Jul 1, 2021
- Mettler Toledo Instrument (Shanghai) Company Limited
- Baohui Liu
- G01 - MEASURING TESTING
Information Patent Application
WEIGH MODULE
- Publication number 20210199487
- Publication date Jul 1, 2021
- Mettler Toledo Instrument (Shanghai) Company Limited
- Chao Wu
- G01 - MEASURING TESTING
Information Patent Application
WEIGHING SENSOR AND LEVER
- Publication number 20200355544
- Publication date Nov 12, 2020
- Mettler Toledo Instrument (Shanghai) Company Limited
- Chao Wu
- G01 - MEASURING TESTING
Information Patent Application
LOAD CELL HAVING AN OVERLOAD PROTECTION
- Publication number 20180100760
- Publication date Apr 12, 2018
- Mettler-Toledo GmbH
- Chun Yang
- G01 - MEASURING TESTING
Information Patent Application
WEIGH MODULE WITH PARALLEL-GUIDING MECHANISM MODULE
- Publication number 20170131135
- Publication date May 11, 2017
- Mettler-Toledo GmbH
- Chun Yang
- G01 - MEASURING TESTING