Nalan LIV HAMARAT

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DELFT, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting a sample using an assembly comprising a scann...
- Patent number 10,651,009
- Issue date May 12, 2020
- DELMIC IP B.V.
- Jacob Pieter Hoogenboom
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Method for inspecting a sample using an assembly comprising a scann...
- Publication number 20170221675
- Publication date Aug 3, 2017
- DELMIC B.V.
- Jacob Pieter HOOGENBOOM
- G02 - OPTICS