Namhyuk KIM

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Asan-si, KR

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Patents Applicationslast 30 patents

Information Patent Application
DEFECT CLASSIFICATION METHOD AND DEFECT CLASSIFICATION SYSTEM
- Publication number 20240311988
- Publication date Sep 19, 2024
- SAMSUNG DISPLAY CO., LTD.
- Junsu Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY DEVICE INSPECTING APPARATUS AND METHOD
- Publication number 20240201045
- Publication date Jun 20, 2024
- SAMSUNG DISPLAY CO., LTD.
- Junsu Park
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD FOR DISPLAY DEVICE
- Publication number 20230123595
- Publication date Apr 20, 2023
- SAMSUNG DISPLAY CO., LTD.
- Sangjun SEOK
- G01 - MEASURING TESTING