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Nancy L. Michael
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Arlington, TX, US
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last 30 patents
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Patent Grant
Characterizing the integrity of interconnects
Patent number
7,393,702
Issue date
Jul 1, 2008
Board of Regents, The University of Texas System
Choong-Un Kim
G01 - MEASURING TESTING
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Patent Application
CHARACTERIZING THE INTEGRITY OF INTERCONNECTS
Publication number
20060084189
Publication date
Apr 20, 2006
Board of Regents, The University of Texas System
Choong-Un Kim
G01 - MEASURING TESTING