Nancy R. Ota

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Keller, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Statistical method for identifying microcracks in insulators
- Patent number 7,225,681
- Issue date Jun 5, 2007
- Texas Instruments Incorporated
- Daniel J. Stillman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Statistical method for identifying microcracks in insulators
- Publication number 20060273780
- Publication date Dec 7, 2006
- Daniel J. Stillman
- G01 - MEASURING TESTING