Nao OTSUKA

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Current generation circuit
- Patent number 10,503,197
- Issue date Dec 10, 2019
- ABLIC INC.
- Masakazu Sugiura
- G05 - CONTROLLING REGULATING
Information Patent Grant
Secondary battery monitoring device and method for diagnosing failure
- Patent number 10,288,694
- Issue date May 14, 2019
- ABLIC INC.
- Yasuhiro Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Overheat detection circuit and semiconductor device
- Patent number 9,983,067
- Issue date May 29, 2018
- ABLIC INC.
- Masakazu Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current detection circuit
- Patent number 9,733,284
- Issue date Aug 15, 2017
- SII Semiconductor Corporation
- Atsushi Igarashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power supply voltage monitoring circuit, and electronic circuit inc...
- Patent number 9,454,174
- Issue date Sep 27, 2016
- SII SEMICONDUCTOR CORPORATION
- Atsushi Igarashi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Voltage reference circuit
- Patent number 8,829,885
- Issue date Sep 9, 2014
- Seiko Instrumentals Inc.
- Nao Otsuka
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
CURRENT GENERATION CIRCUIT
- Publication number 20190187739
- Publication date Jun 20, 2019
- ABLIC Inc.
- Masakazu SUGIURA
- G05 - CONTROLLING REGULATING
Information Patent Application
SECONDARY BATTERY MONITORING DEVICE AND METHOD FOR DIAGNOSING FAILURE
- Publication number 20180172771
- Publication date Jun 21, 2018
- SII Semiconductor Corporation
- Yasuhiro MIYAMOTO
- G01 - MEASURING TESTING
Information Patent Application
CURRENT DETECTION CIRCUIT
- Publication number 20160305985
- Publication date Oct 20, 2016
- SII Semiconductor Corporation
- Atsushi IGARASHI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20160064916
- Publication date Mar 3, 2016
- SEIKO INSTRUMENTS INC.
- Masakazu SUGIURA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
OVERHEAT DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20150308902
- Publication date Oct 29, 2015
- SEIKO INSTRUMENTS INC.
- Masakazu SUGIURA
- G01 - MEASURING TESTING
Information Patent Application
POWER SUPPLY VOLTAGE MONITORING CIRCUIT, AND ELECTRONIC CIRCUIT INC...
- Publication number 20150309528
- Publication date Oct 29, 2015
- SEIKO INSTRUMENTS INC.
- Atsushi IGARASHI
- G05 - CONTROLLING REGULATING
Information Patent Application
VOLTAGE REFERENCE CIRCUIT
- Publication number 20130249525
- Publication date Sep 26, 2013
- SEIKO INSTRUMENTS INC.
- Nao OTSUKA
- G05 - CONTROLLING REGULATING

Person

Patents Grantslast 30 patents

Current generation circuit

Secondary battery monitoring device and method for diagnosing failure

Overheat detection circuit and semiconductor device

Current detection circuit

Power supply voltage monitoring circuit, and electronic circuit inc...

Voltage reference circuit

Patents Applicationslast 30 patents

CURRENT GENERATION CIRCUIT

SECONDARY BATTERY MONITORING DEVICE AND METHOD FOR DIAGNOSING FAILURE

CURRENT DETECTION CIRCUIT

DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE

OVERHEAT DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE

POWER SUPPLY VOLTAGE MONITORING CIRCUIT, AND ELECTRONIC CIRCUIT INC...

VOLTAGE REFERENCE CIRCUIT