Naoaki KONDO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspecting system and defect inspecting method
- Patent number 12,154,264
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer observation apparatus and wafer observation method
- Patent number 11,670,528
- Issue date Jun 6, 2023
- HITACHI HIGH-TECH CORPORATION
- Naoaki Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample observation device and sample observation method
- Patent number 11,170,483
- Issue date Nov 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation device and defect observation method
- Patent number 11,087,454
- Issue date Aug 10, 2021
- HITACHI HIGH-TECH CORPORATION
- Naoaki Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer observation device
- Patent number 10,977,786
- Issue date Apr 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Naoaki Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation system and defect observation method for semicon...
- Patent number 10,971,325
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Minoru Harada
- G01 - MEASURING TESTING
Information Patent Grant
Defect classification apparatus and defect classification method
- Patent number 10,810,733
- Issue date Oct 20, 2020
- HITACHI HIGH-TECH CORPORATION
- Naoaki Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample observation device and sample observation method
- Patent number 10,559,074
- Issue date Feb 11, 2020
- Hitachi High-Technologies Corporation
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ABNORMALITY DETERMINATION COMPUTER AND ABNORMALITY DETERMINATION ME...
- Publication number 20240273708
- Publication date Aug 15, 2024
- Hitachi, Ltd
- Atsushi MIYAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM
- Publication number 20230238290
- Publication date Jul 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTING SYSTEM AND DEFECT INSPECTING METHOD
- Publication number 20230052350
- Publication date Feb 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Minoru HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE OBSERVATION DEVICE, SAMPLE OBSERVATION METHOD, AND COMPUTER...
- Publication number 20230013887
- Publication date Jan 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akira ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD
- Publication number 20230005123
- Publication date Jan 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer and Visual Inspection Method
- Publication number 20230005120
- Publication date Jan 5, 2023
- Hitachi, Ltd
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE OBSERVATION DEVICE AND METHOD
- Publication number 20220405905
- Publication date Dec 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuki Doi
- G01 - MEASURING TESTING
Information Patent Application
WAFER OBSERVATION APPARATUS AND WAFER OBSERVATION METHOD
- Publication number 20200411345
- Publication date Dec 31, 2020
- HITACHI HIGH-TECH CORPORATION
- Naoaki Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20200126201
- Publication date Apr 23, 2020
- Hitachi High-Technologies Corporation
- Minoru HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD FOR SEMICON...
- Publication number 20200083017
- Publication date Mar 12, 2020
- Hitachi High-Technologies Corporation
- Minoru HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION DEVICE AND DEFECT OBSERVATION METHOD
- Publication number 20200034957
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER OBSERVATION DEVICE
- Publication number 20190266713
- Publication date Aug 29, 2019
- Hitachi High-Technologies Corporation
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION APPARATUS AND DEFECT CLASSIFICATION METHOD
- Publication number 20190139210
- Publication date May 9, 2019
- Hitachi High-Technologies Corporation
- Naoaki KONDO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20180240225
- Publication date Aug 23, 2018
- Hitachi High-Technologies Corporation
- Minoru HARADA
- G06 - COMPUTING CALCULATING COUNTING

Naoaki KONDO

Person

Patents Grantslast 30 patents

Defect inspecting system and defect inspecting method

Wafer observation apparatus and wafer observation method

Sample observation device and sample observation method

Defect observation device and defect observation method

Wafer observation device

Defect observation system and defect observation method for semicon...

Defect classification apparatus and defect classification method

Sample observation device and sample observation method

Patents Applicationslast 30 patents

ABNORMALITY DETERMINATION COMPUTER AND ABNORMALITY DETERMINATION ME...

DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM

DEFECT INSPECTING SYSTEM AND DEFECT INSPECTING METHOD

SAMPLE OBSERVATION DEVICE, SAMPLE OBSERVATION METHOD, AND COMPUTER...

SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD

Computer and Visual Inspection Method

SAMPLE OBSERVATION DEVICE AND METHOD

WAFER OBSERVATION APPARATUS AND WAFER OBSERVATION METHOD

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD FOR SEMICON...

DEFECT OBSERVATION DEVICE AND DEFECT OBSERVATION METHOD

WAFER OBSERVATION DEVICE

DEFECT CLASSIFICATION APPARATUS AND DEFECT CLASSIFICATION METHOD

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD