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Naoaki Narumi
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Isehara, JP
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last 30 patents
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Patent Grant
Timing-signal delay equipment
Patent number
4,939,677
Issue date
Jul 3, 1990
Nippon Telegraph & Telephone Corporation
Taiichi Otuji
G01 - MEASURING TESTING
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Patent Grant
IC test system
Patent number
4,928,278
Issue date
May 22, 1990
Nippon Telegraph & Telephone Corporation
Taiichi Otsuji
G01 - MEASURING TESTING