Naoaki Wakayama

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Tokai, JP

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Patents Grantslast 30 patents

Information Patent Grant
Gamma ray compensation-type neutron ionization chamber
- Patent number 4,682,036
- Issue date Jul 21, 1987
- Japan Atomic Energy Research Institute
- Naoaki Wakayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sensing liquid level
- Patent number 4,423,629
- Issue date Jan 3, 1984
- Japan Atomic Energy Research Institute
- Katsuyuki Ara
- G01 - MEASURING TESTING
Information Patent Grant
Gamma-ray compensated ionization chamber
- Patent number 4,302,696
- Issue date Nov 24, 1981
- Mitsubishi Denki Kabushiki Kaisha
- Naoaki Wakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for shortening response time of logarithmic measuring apparatus
- Patent number 4,228,355
- Issue date Oct 14, 1980
- Japan Atomic Energy Research Institute
- Naoaki Wakayama
- G06 - COMPUTING CALCULATING COUNTING