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Naofumi Hino
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Hirakata-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Measuring apparatus and method for thin board
Patent number
7,178,393
Issue date
Feb 20, 2007
Matsushita Electric Industrial Co., Ltd.
Keishi Kubo
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Measuring apparatus and method for thin board
Publication number
20050223791
Publication date
Oct 13, 2005
Keishi Kubo
G01 - MEASURING TESTING