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Naohiko FUKAYA
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Automatic analyzer
Patent number
11,719,714
Issue date
Aug 8, 2023
HITACHI HIGH-TECH CORPORATION
Sayaka Sarwar
G01 - MEASURING TESTING
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Patent Grant
Automatic analyzer and information processing apparatus
Patent number
11,156,624
Issue date
Oct 26, 2021
HITACHI HIGH-TECH CORPORATION
Naohiko Fukaya
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
AUTOMATIC ANALYZER AND OPERATION METHOD THEREOF
Publication number
20240377421
Publication date
Nov 14, 2024
HITACHI HIGH-TECH CORPORATION
Naohiko Fukaya
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20200264206
Publication date
Aug 20, 2020
Hitachi High-Technologies Corporation
Sayaka SARWAR
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND INFORMATION PROCESSING APPARATUS
Publication number
20190187164
Publication date
Jun 20, 2019
Hitachi High-Technologies Corporation
Naohiko FUKAYA
G06 - COMPUTING CALCULATING COUNTING