Naohiko Nishigaki

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit, semiconductor integrated circuit...
- Patent number 8,028,255
- Issue date Sep 27, 2011
- Ricoh Company, Ltd.
- Tomoki Satoi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan test circuit, semiconductor integrated circuit and scan enable...
- Patent number 7,836,370
- Issue date Nov 16, 2010
- Ricoh Company, Ltd.
- Tomoki Satoi
- G01 - MEASURING TESTING
Information Patent Grant
Method of finding DC test point of an integrated circuit
- Patent number 5,706,294
- Issue date Jan 6, 1998
- Ricoh Company, Ltd.
- Toshihiro Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT...
- Publication number 20080222592
- Publication date Sep 11, 2008
- Tomoki Satoi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN TEST CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND SCAN ENABLE...
- Publication number 20080222470
- Publication date Sep 11, 2008
- Tomoki Satoi
- G01 - MEASURING TESTING