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Naohiro Fujisawa

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  • Fujisawa-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Flexible IC tag
    • Patent number 10,037,485
    • Issue date Jul 31, 2018
    • NOK Corporation
    • Tomoko Nakano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Integrated circuit tag
    • Patent number D770991
    • Issue date Nov 8, 2016
    • NOK Corporation
    • Tomoko Nakano
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    IC tag
    • Patent number 9,183,484
    • Issue date Nov 10, 2015
    • NOK Corporation
    • Tomoko Nakano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Integrated circuit tag
    • Patent number D731990
    • Issue date Jun 16, 2015
    • NOK Corporation
    • Tomoko Nakano
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Seal structure for electronic equipment
    • Patent number 8,833,772
    • Issue date Sep 16, 2014
    • Nippon Mektron, Ltd.
    • Takashi Sasaki
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

  • Information Patent Application

    PARTICLE ANALYSIS DEVICE AND METHOD FOR PRODUCING SAME
    • Publication number 20230332998
    • Publication date Oct 19, 2023
    • NOK Corporation
    • Takumi YOSHITOMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PARTICLE SEPARATION DEVICE
    • Publication number 20230077861
    • Publication date Mar 16, 2023
    • NOK Corporation
    • Yuki MUROTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PARTICLE ANALYSIS DEVICE
    • Publication number 20230074523
    • Publication date Mar 9, 2023
    • NOK Corporation
    • Takumi YOSHITOMI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    PARTICLE ANALYSIS DEVICE
    • Publication number 20230077021
    • Publication date Mar 9, 2023
    • NOK Corporation
    • Takumi YOSHITOMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR MANUFACTURING PARTICLE ANALYZER AND THE PARTICLE ANALYZER
    • Publication number 20220341840
    • Publication date Oct 27, 2022
    • NOK Corporation
    • Takumi YOSHITOMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    PARTICLE ANALYSIS DEVICE
    • Publication number 20220260524
    • Publication date Aug 18, 2022
    • NOK Corporation
    • Yuki MUROTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR STORING PARTICLE ANALYZER AND METHOD FOR MANUFACTURING T...
    • Publication number 20220252500
    • Publication date Aug 11, 2022
    • NOK Corporation
    • Yuki MUROTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC Tag
    • Publication number 20170032233
    • Publication date Feb 2, 2017
    • NOK Corporation
    • Tomoko NAKANO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    IC Tag
    • Publication number 20150122891
    • Publication date May 7, 2015
    • NOK Corporation
    • Tomoko Nakano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SEAL STRUCTURE FOR ELECTRONIC EQUIPMENT
    • Publication number 20110140375
    • Publication date Jun 16, 2011
    • NOK Corporation
    • Takashi Sasaki
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR