Naohiro Makihira

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 10,551,432
- Issue date Feb 4, 2020
- Renesas Electronics Corporation
- Toshitsugu Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 10,141,295
- Issue date Nov 27, 2018
- Renesas Electronics Corporation
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method and semiconductor device
- Patent number 10,109,568
- Issue date Oct 23, 2018
- Renesas Electronics Corporation
- Jun Matsuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 9,945,903
- Issue date Apr 17, 2018
- Renesas Electronics Corporation
- Toshitsugu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device and inspecting an el...
- Patent number 9,905,482
- Issue date Feb 27, 2018
- Renesas Electronics Corporation
- Toshitsugu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,825,017
- Issue date Nov 21, 2017
- Renesas Electronics Corporation
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device and inspecting an el...
- Patent number 9,761,501
- Issue date Sep 12, 2017
- Renesas Electronics Corporation
- Toshitsugu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,515,000
- Issue date Dec 6, 2016
- Renesas Electronics Corporation
- Toshitsugu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,490,218
- Issue date Nov 8, 2016
- Renesas Electronics Corporation
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 9,230,938
- Issue date Jan 5, 2016
- Renesas Electronics Corporation
- Akio Hasebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,053,954
- Issue date Jun 9, 2015
- Renesas Electronics Corporation
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 8,945,953
- Issue date Feb 3, 2015
- Renesas Electronics Corporation
- Akio Hasebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 8,603,840
- Issue date Dec 10, 2013
- Renesas Electronics Corporation
- Jun Matsuhashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufactuing a semiconductor integrated circuit device
- Patent number 7,524,697
- Issue date Apr 28, 2009
- Renesas Technology Corp.
- Naohiro Makihira
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20180340976
- Publication date Nov 29, 2018
- RENESAS ELECTRONICS CORPORATION
- Toshitsugu ISHII
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE
- Publication number 20180102310
- Publication date Apr 12, 2018
- RENESAS ELECTRONICS CORPORATION
- Jun MATSUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20180040598
- Publication date Feb 8, 2018
- Renesas Electronics Corporation
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20170338159
- Publication date Nov 23, 2017
- RENESAS ELECTRONICS CORPORATION
- Toshitsugu Ishii
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20170025318
- Publication date Jan 26, 2017
- RENESAS ELECTRONICS CORPORATION
- Toshitsugu ISHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20170005080
- Publication date Jan 5, 2017
- RENESAS ELECTRONICS CORPORATION
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Manufacturing Semiconductor Device
- Publication number 20160141215
- Publication date May 19, 2016
- RENESAS ELECTRONICS CORPORATION
- Toshitsugu ISHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20160064291
- Publication date Mar 3, 2016
- RENESAS ELECTRONICS CORPORATION
- Toshitsugu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20150243605
- Publication date Aug 27, 2015
- RENESAS ELECTRONICS CORPORATION
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20150111317
- Publication date Apr 23, 2015
- Renesas Electronics Corporation
- Akio Hasebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20140287541
- Publication date Sep 25, 2014
- RENESAS ELECTRONICS CORPORATION
- Bunji Yasumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20140179032
- Publication date Jun 26, 2014
- RENESAS ELECTRONICS CORPORATION
- Akio Hasebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20120244648
- Publication date Sep 27, 2012
- Renesas Electronics Corporation
- Jun MATSUHASHI
- G01 - MEASURING TESTING

Naohiro Makihira

Person

Patents Grantslast 30 patents

Method of manufacturing semiconductor device

Method for manufacturing semiconductor device

Semiconductor device manufacturing method and semiconductor device

Semiconductor device manufacturing method

Method of manufacturing a semiconductor device and inspecting an el...

Method for manufacturing semiconductor device

Method of manufacturing a semiconductor device and inspecting an el...

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Method of manufacturing semiconductor device

Method for manufacturing semiconductor device

Method of manufacturing semiconductor device

Manufacturing method of semiconductor device

Method for manufactuing a semiconductor integrated circuit device

Patents Applicationslast 30 patents

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE MANUFACTURING METHOD

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Method for Manufacturing Semiconductor Device

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR CHIP AND SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE