Naohiro Matsukawa

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Memory system
- Patent number 9,183,000
- Issue date Nov 10, 2015
- Kabushiki Kaisha Toshiba
- Makoto Ichida
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of evaluating a semiconductor storage device
- Patent number 8,400,833
- Issue date Mar 19, 2013
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Cell characteristic measuring circuit for a nonvolatile semiconduct...
- Patent number 5,650,961
- Issue date Jul 22, 1997
- Kabushiki Kaisha Toshiba
- Toshihiko Himeno
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile semiconductor memory device capable of preventing exce...
- Patent number 5,559,736
- Issue date Sep 24, 1996
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device having a small number of in...
- Patent number 5,515,327
- Issue date May 7, 1996
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory circuit with high speed read-out
- Patent number 5,350,938
- Issue date Sep 27, 1994
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 5,172,196
- Issue date Dec 15, 1992
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Reduced projection type step- and repeat-exposure apparatus
- Patent number 4,845,530
- Issue date Jul 4, 1989
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing nonvolatile semiconductor memory device by...
- Patent number 4,642,881
- Issue date Feb 17, 1987
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a semiconductor device with a floating gate
- Patent number 4,620,361
- Issue date Nov 4, 1986
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making high density dielectric isolated gate MOS transistor
- Patent number 4,610,078
- Issue date Sep 9, 1986
- Kabushiki Kaisha Toshiba
- Naohiro Matsukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device resistant to soft errors
- Patent number 4,592,026
- Issue date May 27, 1986
- Shaibaura Denki Kabushiki Kaisha
- Naohiro Matsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having tunnel diodes
- Patent number 4,573,143
- Issue date Feb 25, 1986
- Tokyo Shibaura Denki Kabushiki Kaisha
- Naohiro Matsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 4,459,325
- Issue date Jul 10, 1984
- Tokyo Shibaura Denki Kabushiki Kaisha
- Hiroshi Nozawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming dielectric isolation of device regions
- Patent number 4,419,142
- Issue date Dec 6, 1983
- Tokyo Shibaura Denki Kabushiki Kaisha
- Naohiro Matsukawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230282747
- Publication date Sep 7, 2023
- KIOXIA Corporation
- Takao SUEYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200203529
- Publication date Jun 25, 2020
- Toshiba Memory Corporation
- Takao SUEYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY SYSTEM
- Publication number 20130227268
- Publication date Aug 29, 2013
- Makoto ICHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EVALUATING A SEMICONDUCTOR STORAGE DEVICE
- Publication number 20120081965
- Publication date Apr 5, 2012
- Kabushiki Kaisha Toshiba
- Naohiro MATSUKAWA
- G11 - INFORMATION STORAGE

Naohiro Matsukawa

Person

Patents Grantslast 30 patents

Memory system

Method of evaluating a semiconductor storage device

Cell characteristic measuring circuit for a nonvolatile semiconduct...

Non-volatile semiconductor memory device capable of preventing exce...

Nonvolatile semiconductor memory device having a small number of in...

Nonvolatile semiconductor memory circuit with high speed read-out

Nonvolatile semiconductor memory device

Reduced projection type step- and repeat-exposure apparatus

Method of manufacturing nonvolatile semiconductor memory device by...

Method for producing a semiconductor device with a floating gate

Method of making high density dielectric isolated gate MOS transistor

Memory device resistant to soft errors

Semiconductor memory device having tunnel diodes

Semiconductor device and method for manufacturing the same

Method of forming dielectric isolation of device regions

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

MEMORY SYSTEM

METHOD OF EVALUATING A SEMICONDUCTOR STORAGE DEVICE